Mass transport and thermal stability of TiN/Al 2O 3/InGaAs nanofilms

Journal of Applied Physics

Volumn 112, Issue 5, 2012, Pages

  Ceballos Sanchez, O ^a   Sanchez Martinez, A ^a   Vazquez Lepe, M O ^a   Duong, T ^b   Arroyave, R ^b   Espinosa Magana F ^c   Herrera Gomez, A ^a  

^a DEPARTAMENTO DE FÍSICA   (Mexico)

^b Department of Electrical and Computer Engineering   (United States)

^c CENTRO DE INVESTIGACIÓN EN MATERIALES AVANZADOS   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE-RESOLVED X-RAY PHOTOELECTRON SPECTROSCOPY; DENSITY FUNCTIONAL THEORY CALCULATIONS; DIELECTRIC LAYER; INDIUM ATOMS; NANO FILMS;

DENSITY FUNCTIONAL THEORY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; PHOTOELECTRONS; SUBSTRATES; TITANIUM;

GALLIUM ALLOYS;

EID: 84866397768     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4751435     Document Type: Conference Paper

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