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Volumn 182, Issue 1-2, 2010, Pages 81-83
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Effect of monochromator X-ray Bragg reflection on photoelectric cross section
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Author keywords
Angular dependence; ARXPS; Bragg reflection; Photoelectric cross section; Polarization; XPS
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Indexed keywords
ANGULAR DEPENDENCE;
ARXPS;
BRAGG REFLECTION;
PHOTOELECTRIC CROSS-SECTIONS;
XPS;
ELECTRIC FIELDS;
LASER OPTICS;
LIGHT POLARIZATION;
LIGHT REFLECTION;
MONOCHROMATORS;
POLARIZATION;
X RAY PHOTOELECTRON SPECTROSCOPY;
X RAYS;
PHOTOELECTRICITY;
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EID: 78049478522
PISSN: 03682048
EISSN: None
Source Type: Journal
DOI: 10.1016/j.elspec.2010.07.009 Document Type: Article |
Times cited : (36)
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References (12)
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