-
1
-
-
0002173308
-
-
VACUAV 0042-207X 10.1016/S0042-207X(00)00143-3
-
L. Hultman, Vacuum VACUAV 0042-207X 10.1016/S0042-207X(00)00143-3 57, 1 (2000).
-
(2000)
Vacuum
, vol.57
, pp. 1
-
-
Hultman, L.1
-
2
-
-
0008161622
-
-
PRPLCM 0370-1573 10.1016/S0370-1573(01)00018-7
-
I. Pollini, A. Mosser, and J. C. Parlebas, Phys. Rep. PRPLCM 0370-1573 10.1016/S0370-1573(01)00018-7 355, 1 (2001).
-
(2001)
Phys. Rep.
, vol.355
, pp. 1
-
-
Pollini, I.1
Mosser, A.2
Parlebas, J.C.3
-
3
-
-
0000049332
-
-
PRBMDO 0163-1829 10.1103/PhysRevB.25.7183
-
H. Höchst, R. D. Bringans, P. Steiner, and T. Wolf, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.25.7183 25, 7183 (1982).
-
(1982)
Phys. Rev. B
, vol.25
, pp. 7183
-
-
Höchst, H.1
Bringans, R.D.2
Steiner, P.3
Wolf, T.4
-
4
-
-
84956038327
-
-
JVTAD6 0734-2101 10.1116/1.575205
-
A. J. Perry, J. Vac. Sci. Technol. A JVTAD6 0734-2101 10.1116/1.575205 6, 2140 (1988).
-
(1988)
J. Vac. Sci. Technol. a
, vol.6
, pp. 2140
-
-
Perry, A.J.1
-
5
-
-
0033551340
-
-
NATUAS 0028-0836 10.1038/20148
-
S. H. Jhi, J. Ihm, S. G. Louie, and M. L. Cohen, Nature (London) NATUAS 0028-0836 10.1038/20148 399, 132 (1999).
-
(1999)
Nature (London)
, vol.399
, pp. 132
-
-
Jhi, S.H.1
Ihm, J.2
Louie, S.G.3
Cohen, M.L.4
-
6
-
-
0034274290
-
-
THSFAP 0040-6090 10.1016/S0040-6090(00)01049-X
-
D. J. Kim, Y. B. Jung, M. B. Lee, Y. H. Lee, J. H. Lee, and J. H. Lee, Thin Solid Films THSFAP 0040-6090 10.1016/S0040-6090(00)01049-X 372, 276 (2000).
-
(2000)
Thin Solid Films
, vol.372
, pp. 276
-
-
Kim, D.J.1
Jung, Y.B.2
Lee, M.B.3
Lee, Y.H.4
Lee, J.H.5
Lee, J.H.6
-
7
-
-
0037974706
-
-
JAPIAU 0021-8979 10.1063/1.1568521
-
C. S. Shin, D. Gall, N. Hellgren, J. Patscheider, I. Petrov, and J. E. Greene, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1568521 93, 6025 (2003).
-
(2003)
J. Appl. Phys.
, vol.93
, pp. 6025
-
-
Shin, C.S.1
Gall, D.2
Hellgren, N.3
Patscheider, J.4
Petrov, I.5
Greene, J.E.6
-
8
-
-
34548846377
-
-
PRLTAO 0031-9007 10.1103/PhysRevLett.99.125503
-
L. Tsetseris, N. Kalfagiannis, S. Logothetidis, and S. T. Pantelides, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.99.125503 99, 125503 (2007).
-
(2007)
Phys. Rev. Lett.
, vol.99
, pp. 125503
-
-
Tsetseris, L.1
Kalfagiannis, N.2
Logothetidis, S.3
Pantelides, S.T.4
-
9
-
-
37249028717
-
-
PRBMDO 0163-1829 10.1103/PhysRevB.76.224107
-
L. Tsetseris, N. Kalfagiannis, S. Logothetidis, and S. T. Pantelides, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.76.224107 76, 224107 (2007).
-
(2007)
Phys. Rev. B
, vol.76
, pp. 224107
-
-
Tsetseris, L.1
Kalfagiannis, N.2
Logothetidis, S.3
Pantelides, S.T.4
-
10
-
-
0034092121
-
-
SCTEEJ 0257-8972 10.1016/S0257-8972(99)00586-1
-
J. Musil, Surf. Coat. Technol. SCTEEJ 0257-8972 10.1016/S0257-8972(99) 00586-1 125, 322 (2000).
-
(2000)
Surf. Coat. Technol.
, vol.125
, pp. 322
-
-
Musil, J.1
-
11
-
-
4644316458
-
-
JVTBD9 1071-1023 10.1116/1.1689305
-
S. Veprek, H. D. Mannling, A. Niederhofer, D. Ma, and S. Mukherjee, J. Vac. Sci. Technol. B JVTBD9 1071-1023 10.1116/1.1689305 22, L5 (2004).
-
(2004)
J. Vac. Sci. Technol. B
, vol.22
, pp. 5
-
-
Veprek, S.1
Mannling, H.D.2
Niederhofer, A.3
Ma, D.4
Mukherjee, S.5
-
12
-
-
33747846329
-
-
PRLTAO 0031-9007 10.1103/PhysRevLett.97.086102
-
S. Hao, B. Delley, S. Veprek, and C. Stampfl, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.97.086102 97, 086102 (2006).
-
(2006)
Phys. Rev. Lett.
, vol.97
, pp. 086102
-
-
Hao, S.1
Delley, B.2
Veprek, S.3
Stampfl, C.4
-
13
-
-
34548285505
-
-
APPLAB 0003-6951 10.1063/1.2775039
-
S. W. Wang, R. Gudipati, A. S. Rao, T. J. Bostelmann, and Y. G. Shen, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.2775039 91, 081916 (2007).
-
(2007)
Appl. Phys. Lett.
, vol.91
, pp. 081916
-
-
Wang, S.W.1
Gudipati, R.2
Rao, A.S.3
Bostelmann, T.J.4
Shen, Y.G.5
-
14
-
-
84955036081
-
-
JVTAD6 0734-2101 10.1116/1.578074
-
I. Petrov, L. Hultman, J. L. Sundgren, and J. E. Greene, J. Vac. Sci. Technol. A JVTAD6 0734-2101 10.1116/1.578074 10, 265 (1992).
-
(1992)
J. Vac. Sci. Technol. a
, vol.10
, pp. 265
-
-
Petrov, I.1
Hultman, L.2
Sundgren, J.L.3
Greene, J.E.4
-
15
-
-
0040712347
-
-
MSAPE3 0921-5093 10.1016/S0921-5093(98)00731-X
-
W. Ensinger and K. Volz, Mater. Sci. Eng., A MSAPE3 0921-5093 10.1016/S0921-5093(98)00731-X 253, 234 (1998).
-
(1998)
Mater. Sci. Eng., a
, vol.253
, pp. 234
-
-
Ensinger, W.1
Volz, K.2
-
17
-
-
0001461308
-
-
APPLAB 0003-6951 10.1063/1.116213
-
M. Danek, M. Liao, J. Tseng, K. Littau, D. Saigal, H. Zhang, R. Mosely, and M. Eizenberg, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.116213 68, 1015 (1996).
-
(1996)
Appl. Phys. Lett.
, vol.68
, pp. 1015
-
-
Danek, M.1
Liao, M.2
Tseng, J.3
Littau, K.4
Saigal, D.5
Zhang, H.6
Mosely, R.7
Eizenberg, M.8
-
18
-
-
0036544456
-
-
JAPLD8 0021-4922 10.1143/JJAP.41.L418
-
J. H. Yun, E. S. Choi, C. M. Jang, and C. S. Lee, Jpn. J. Appl. Phys., Part 2 JAPLD8 0021-4922 10.1143/JJAP.41.L418 41, L418 (2002).
-
(2002)
Jpn. J. Appl. Phys., Part 2
, vol.41
, pp. 418
-
-
Yun, J.H.1
Choi, E.S.2
Jang, C.M.3
Lee, C.S.4
-
19
-
-
0036230127
-
-
ESLEF6 1099-0062 10.1149/1.1420925
-
M. Juppo, P. Alen, M. Ritala, T. Sajavaara, J. Keinonen, and M. Leskela, Electrochem. Solid-State Lett. ESLEF6 1099-0062 10.1149/1.1420925 5, C4 (2002).
-
(2002)
Electrochem. Solid-State Lett.
, vol.5
, pp. 4
-
-
Juppo, M.1
Alen, P.2
Ritala, M.3
Sajavaara, T.4
Keinonen, J.5
Leskela, M.6
-
21
-
-
0032156058
-
-
JAPNDE 0021-4922 10.1143/JJAP.37.4999
-
J. S. Min, Y. W. Son, W. G. Kang, S. S. Chun, and S. W. Kang, Jpn. J. Appl. Phys., Part 1 JAPNDE 0021-4922 10.1143/JJAP.37.4999 37, 4999 (1998).
-
(1998)
Jpn. J. Appl. Phys., Part 1
, vol.37
, pp. 4999
-
-
Min, J.S.1
Son, Y.W.2
Kang, W.G.3
Chun, S.S.4
Kang, S.W.5
-
22
-
-
14744275744
-
-
JESOAN 0013-4651 10.1149/1.1825913
-
J. Y. Kim, D. Y. Kim, H. O. Park, and H. T. Jeon, J. Electrochem. Soc. JESOAN 0013-4651 10.1149/1.1825913 152, G29 (2005).
-
(2005)
J. Electrochem. Soc.
, vol.152
, pp. 29
-
-
Kim, J.Y.1
Kim, D.Y.2
Park, H.O.3
Jeon, H.T.4
-
23
-
-
0000765347
-
-
PLYHDE 0277-5387 10.1016/S0277-5387(00)80253-3
-
D. M. Hoffman, Polyhedron PLYHDE 0277-5387 10.1016/S0277-5387(00)80253-3 13, 1169 (1994).
-
(1994)
Polyhedron
, vol.13
, pp. 1169
-
-
Hoffman, D.M.1
-
24
-
-
0031382041
-
-
ASUSEE 0169-4332 10.1016/S0169-4332(97)00387-5
-
M. Ritala, T. Asikainen, M. Leskela, J. Joikinen, R. Lappalainen, M. Utriainen, L. Niinisto, and E. Ristolainen, Appl. Surf. Sci. ASUSEE 0169-4332 10.1016/S0169-4332(97)00387-5 120, 199 (1997).
-
(1997)
Appl. Surf. Sci.
, vol.120
, pp. 199
-
-
Ritala, M.1
Asikainen, T.2
Leskela, M.3
Joikinen, J.4
Lappalainen, R.5
Utriainen, M.6
Niinisto, L.7
Ristolainen, E.8
-
25
-
-
0032138851
-
-
JESOAN 0013-4651 10.1149/1.1838736
-
M. Ritala, M. Leskela, E. Rauhala, and J. Jokinen, J. Electrochem. Soc. JESOAN 0013-4651 10.1149/1.1838736 145, 2914 (1998).
-
(1998)
J. Electrochem. Soc.
, vol.145
, pp. 2914
-
-
Ritala, M.1
Leskela, M.2
Rauhala, E.3
Jokinen, J.4
-
26
-
-
3342970606
-
-
JAPIAU 0021-8979 10.1063/1.1322068
-
E. K. Evangelou, N. Konofaos, X. A. Aslanoglou, C. A. Dimitriadis, P. Patsalas, S. Logothetidis, M. Kokkoris, E. Kossionides, R. Vlastou, and R. Groetschel, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1322068 88, 7192 (2000).
-
(2000)
J. Appl. Phys.
, vol.88
, pp. 7192
-
-
Evangelou, E.K.1
Konofaos, N.2
Aslanoglou, X.A.3
Dimitriadis, C.A.4
Patsalas, P.5
Logothetidis, S.6
Kokkoris, M.7
Kossionides, E.8
Vlastou, R.9
Groetschel, R.10
-
27
-
-
0035386391
-
-
SCTEEJ 0257-8972
-
M. Nose, M. Zhou, E. Honbo, M. Yokota, and S. Saji, Surf. Coat. Technol. SCTEEJ 0257-8972 142-144, 211 (2001).
-
(2001)
Surf. Coat. Technol.
, vol.142-144
, pp. 211
-
-
Nose, M.1
Zhou, M.2
Honbo, E.3
Yokota, M.4
Saji, S.5
-
28
-
-
84861435165
-
-
JAPIAU 0021-8979 10.1063/1.1459750
-
R. Kroger, M. Eizenberg, C. Marcadal, and L. Chen, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1459750 91, 5149 (2002).
-
(2002)
J. Appl. Phys.
, vol.91
, pp. 5149
-
-
Kroger, R.1
Eizenberg, M.2
Marcadal, C.3
Chen, L.4
-
29
-
-
16744368287
-
-
SCTEEJ 0257-8972
-
E. Alves, A. R. Ramos, N. P. Barradas, F. Vaz, P. Cerqueira, L. Rebouta, and U. Kreissig, Surf. Coat. Technol. SCTEEJ 0257-8972 180-181, 372 (2004).
-
(2004)
Surf. Coat. Technol.
, vol.180-181
, pp. 372
-
-
Alves, E.1
Ramos, A.R.2
Barradas, N.P.3
Vaz, F.4
Cerqueira, P.5
Rebouta, L.6
Kreissig, U.7
-
30
-
-
1342347468
-
-
THSFAP 0040-6090
-
F. Vaz, P. Cerqueira, L. Rebouta, S. M. C. Nascimento, E. Alves, P. Goudeau, J. R. Riviere, K. Pischow, and J. de Rijk, Thin Solid Films THSFAP 0040-6090 447-448, 449 (2004).
-
(2004)
Thin Solid Films
, vol.447-448
, pp. 449
-
-
Vaz, F.1
Cerqueira, P.2
Rebouta, L.3
Nascimento, S.M.C.4
Alves, E.5
Goudeau, P.6
Riviere, J.R.7
Pischow, K.8
De Rijk, J.9
-
34
-
-
33645898818
-
-
PRBMDO 0163-1829 10.1103/PhysRevB.45.13244
-
J. P. Perdew and Y. Wang, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.45.13244 45, 13244 (1992).
-
(1992)
Phys. Rev. B
, vol.45
, pp. 13244
-
-
Perdew, J.P.1
Wang, Y.2
-
35
-
-
25744460922
-
-
PRBMDO 0163-1829 10.1103/PhysRevB.50.17953
-
P. E. Blöchl, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.50. 17953 50, 17953 (1994).
-
(1994)
Phys. Rev. B
, vol.50
, pp. 17953
-
-
Blöchl, P.E.1
-
36
-
-
0011236321
-
-
PRBMDO 0163-1829 10.1103/PhysRevB.59.1758
-
G. Kresse and D. Joubert, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.59.1758 59, 1758 (1999).
-
(1999)
Phys. Rev. B
, vol.59
, pp. 1758
-
-
Kresse, G.1
Joubert, D.2
-
37
-
-
12344328934
-
-
PLRBAQ 0556-2805 10.1103/PhysRevB.8.5747
-
D. J. Chadi and M. L. Cohen, Phys. Rev. B PLRBAQ 0556-2805 10.1103/PhysRevB.8.5747 8, 5747 (1973).
-
(1973)
Phys. Rev. B
, vol.8
, pp. 5747
-
-
Chadi, D.J.1
Cohen, M.L.2
-
38
-
-
34248638205
-
-
MIENEF 0167-9317 10.1016/j.mee.2007.04.076
-
L. Tsetseris, D. M. Fleetwood, R. D. Schrimpf, X. J. Zhou, I. G. Batyrev, and S. T. Pantelides, Microelectron. Eng. MIENEF 0167-9317 10.1016/j.mee.2007. 04.076 84, 2344 (2007).
-
(2007)
Microelectron. Eng.
, vol.84
, pp. 2344
-
-
Tsetseris, L.1
Fleetwood, D.M.2
Schrimpf, R.D.3
Zhou, X.J.4
Batyrev, I.G.5
Pantelides, S.T.6
-
39
-
-
44649098861
-
-
ACMAFD 1359-6454 10.1016/j.actamat.2008.02.020
-
L. Tsetseris and S. T. Pantelides, Acta Mater. ACMAFD 1359-6454 10.1016/j.actamat.2008.02.020 56, 2864 (2008).
-
(2008)
Acta Mater.
, vol.56
, pp. 2864
-
-
Tsetseris, L.1
Pantelides, S.T.2
-
40
-
-
49649157572
-
-
SSCOA4 0038-1098 10.1016/0038-1098(71)90313-9
-
O. Jepson and O. K. Andersen, Solid State Commun. SSCOA4 0038-1098 10.1016/0038-1098(71)90313-9 9, 1763 (1971).
-
(1971)
Solid State Commun.
, vol.9
, pp. 1763
-
-
Jepson, O.1
Andersen, O.K.2
-
41
-
-
0030172430
-
-
JMREEE 0884-2914 10.1557/JMR.1996.0182
-
R. Chowdhury, R. D. Vispute, K. Jagannadham, and J. Narayan, J. Mater. Res. JMREEE 0884-2914 10.1557/JMR.1996.0182 11, 1458 (1996).
-
(1996)
J. Mater. Res.
, vol.11
, pp. 1458
-
-
Chowdhury, R.1
Vispute, R.D.2
Jagannadham, K.3
Narayan, J.4
-
44
-
-
11244250899
-
-
JMREEE 0884-2914 10.1557/JMR.2004.0444
-
H. C. Barshilia and K. S. Rajam, J. Mater. Res. JMREEE 0884-2914 10.1557/JMR.2004.0444 19, 3196 (2004).
-
(2004)
J. Mater. Res.
, vol.19
, pp. 3196
-
-
Barshilia, H.C.1
Rajam, K.S.2
-
45
-
-
2342563076
-
-
THSFAP 0040-6090 10.1016/j.tsf.2003.12.043
-
S. M. Oh and T. Ishigaki, Thin Solid Films THSFAP 0040-6090 10.1016/j.tsf.2003.12.043 457, 186 (2004).
-
(2004)
Thin Solid Films
, vol.457
, pp. 186
-
-
Oh, S.M.1
Ishigaki, T.2
-
46
-
-
3042544372
-
-
SCTEEJ 0257-8972 10.1016/j.surfcoat.2003.12.011
-
P. W. Shum, K. Y. Li, Z. F. Zhou, and Y. G. Shen, Surf. Coat. Technol. SCTEEJ 0257-8972 10.1016/j.surfcoat.2003.12.011 185, 245 (2004).
-
(2004)
Surf. Coat. Technol.
, vol.185
, pp. 245
-
-
Shum, P.W.1
Li, K.Y.2
Zhou, Z.F.3
Shen, Y.G.4
-
48
-
-
0027946619
-
-
NATUAS 0028-0836 10.1038/371683a0
-
B. Silvi and A. Savin, Nature (London) NATUAS 0028-0836 10.1038/371683a0 371, 683 (1994).
-
(1994)
Nature (London)
, vol.371
, pp. 683
-
-
Silvi, B.1
Savin, A.2
-
49
-
-
0000288767
-
-
JPCAFH 1089-5639 10.1021/jp992784c
-
B. Silvi and C. Gatti, J. Phys. Chem. A JPCAFH 1089-5639 10.1021/jp992784c 104, 947 (2000).
-
(2000)
J. Phys. Chem. a
, vol.104
, pp. 947
-
-
Silvi, B.1
Gatti, C.2
-
50
-
-
0942267575
-
-
JVTBD9 1071-1023 10.1116/1.1622676
-
H. Kim, J. Vac. Sci. Technol. B JVTBD9 1071-1023 10.1116/1.1622676 21, 2231 (2003).
-
(2003)
J. Vac. Sci. Technol. B
, vol.21
, pp. 2231
-
-
Kim, H.1
-
51
-
-
33745293437
-
-
JAPIAU 0021-8979 10.1063/1.2197287
-
G. Abadias, Y. Y. Tse, P. Guérin, and V. Pelosin, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.2197287 99, 113519 (2006).
-
(2006)
J. Appl. Phys.
, vol.99
, pp. 113519
-
-
Abadias, G.1
Tse, Y.Y.2
Guérin, P.3
Pelosin, V.4
-
52
-
-
0010034760
-
-
JAPIAU 0021-8979 10.1063/1.1319973
-
J. D. Kamminga, T. H. de Keijser, R. Delhez, and E. J. Mittemeijer, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1319973 88, 6332 (2000).
-
(2000)
J. Appl. Phys.
, vol.88
, pp. 6332
-
-
Kamminga, J.D.1
De Keijser, T.H.2
Delhez, R.3
Mittemeijer, E.J.4
-
53
-
-
34247886010
-
-
MCRLAS 0026-2714 10.1016/j.microrel.2006.10.011
-
S. T. Pantelides, L. Tsetseris, S. N. Rashkeev, X. J. Zhou, D. M. Fleetwood, and R. D. Schrimpf, Microelectron. Reliab. MCRLAS 0026-2714 10.1016/j.microrel.2006.10.011 47, 903 (2007).
-
(2007)
Microelectron. Reliab.
, vol.47
, pp. 903
-
-
Pantelides, S.T.1
Tsetseris, L.2
Rashkeev, S.N.3
Zhou, X.J.4
Fleetwood, D.M.5
Schrimpf, R.D.6
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