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Volumn 184, Issue 11-12, 2012, Pages 533-541

Resolving overlapping peaks in ARXPS data: The effect of noise and fitting method

Author keywords

ARXPS; Effect of noise; Overlapping peaks; Peak fitting; Sequential fitting; Simultaneous fitting; XPS

Indexed keywords

ARXPS; EFFECT OF NOISE; OVERLAPPING PEAKS; PEAK FITTING; SEQUENTIAL FITTING; SIMULTANEOUS FITTING;

EID: 84855799453     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2011.08.004     Document Type: Article
Times cited : (44)

References (23)
  • 11
    • 84855764968 scopus 로고    scopus 로고
    • http://qro.cinvestav.mx/∼aanalyzer/
    • ®, www.AAnalyzer.com, http://qro.cinvestav.mx/ ∼aanalyzer/.
  • 23
    • 84855777342 scopus 로고    scopus 로고
    • Correction of equipment-related and sample-related peak-energy shifts
    • A. Herrera-Gomez, et al., "Correction of equipment-related and sample-related peak-energy shifts," Internal Report 2010, http://www.qro.cinvestav.mx/∼aanalyzer/fixingShifts.pdf.
    • (2010) Internal Report
    • Herrera-Gomez, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.