|
Volumn 184, Issue 11-12, 2012, Pages 533-541
|
Resolving overlapping peaks in ARXPS data: The effect of noise and fitting method
|
Author keywords
ARXPS; Effect of noise; Overlapping peaks; Peak fitting; Sequential fitting; Simultaneous fitting; XPS
|
Indexed keywords
ARXPS;
EFFECT OF NOISE;
OVERLAPPING PEAKS;
PEAK FITTING;
SEQUENTIAL FITTING;
SIMULTANEOUS FITTING;
BINDING ENERGY;
INFORMATION USE;
X RAY PHOTOELECTRON SPECTROSCOPY;
PARAMETER ESTIMATION;
|
EID: 84855799453
PISSN: 03682048
EISSN: None
Source Type: Journal
DOI: 10.1016/j.elspec.2011.08.004 Document Type: Article |
Times cited : (44)
|
References (23)
|