Experimental evaluation of a spherical aberration-corrected TEM and STEM

Journal of Electron Microscopy

Volumn 54, Issue 2, 2005, Pages 119-121

  Sawada, Hidetaka ^a   Tomita, Takeshi ^a   Naruse, Mikio ^a   Honda, Toshikazu ^a   Hambridge, Paul ^a   Hartel, Peter ^b   Haider, Maximilian ^b   Hetherington, Crispin ^c   Doole, Ron ^c   Kirkland, Angus ^c   Hutchison, John ^c   Titchmarsh, John ^c   Cockayne, David ^c  

^a JEOL LTD   (Japan)

^b CEOS GmbH   (Germany)

^c UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Hexapole corrector; High resolution; Spherical aberration

Indexed keywords

ABERRATIONS; ASPHERICS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; SCANNING ELECTRON MICROSCOPY; SPHERES;

ABERRATION CORRECTED TEM; ABERRATION-CORRECTED STEM; EXPERIMENTAL EVALUATION; HEXAPOLE CORRECTOR; HIGH RESOLUTION; IMAGE FORMING; IMAGE-FORMING SYSTEMS; PERFORMANCE; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SPHERICAL ABERRATIONS;

PROBES;

EID: 23944440154     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/jmicro/dfi001     Document Type: Article

References (8)

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