Effect of convergent beam semiangle on image intensity in HAADF STEM images

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 66, Issue 1, 2010, Pages 10-16

  Kuramochi, Koji ^a   Kotaka, Yasutoshi ^b   Yamazaki, Takashi ^b   Ohtsuka, Masahiro ^a   Hashimoto, Iwao ^a   Watanabe, Kazuto ^c  

^a TOKYO UNIVERSITY OF SCIENCE   (Japan)

^b FUJITSU LABORATORIES LTD   (Japan)

^c TOKYO METROPOLITAN COLLEGE OF INDUSTRIAL TECHNOLOGY   (Japan)

Author keywords

Convergent beam semiangle; HAADF STEM; High angle annular dark field scanning transmission electron microscopy; Thickness dependence; Tricobalt tetroxide

Indexed keywords

EID: 73449128969     PISSN: 01087673     EISSN: 16005724     Source Type: Journal    
DOI: 10.1107/S0108767309039750     Document Type: Article

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