Lattice imaging in low-angle and high-angle bright-field scanning transmission electron microscopy

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 60, Issue 6, 2004, Pages 591-597

  Watanabe, K ^a   Kikuchi, Y ^b   Yamazaki, T ^c   Asano, E ^c   Nakanishi, N ^c   Kotaka, Y ^d   Okunishi, E ^e   Hashimoto, I ^c  

^a TOKYO METROPOLITAN COLLEGE OF INDUSTRIAL TECHNOLOGY   (Japan)

^b ASSOCIATION OF SUPER ADVANCED ELECTRONICS TECHNOLOGIES ASET   (Japan)

^c TOKYO UNIVERSITY OF SCIENCE   (Japan)

^d FUJITSU LABORATORIES LTD   (Japan)

^e JEOL LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 19944369759     PISSN: 01087673     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108767304020288     Document Type: Article

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