Chemical identification of single atoms in heterogeneous III-IV chains on Si(100) surface by means of nc-AFM and DFT calculations

ACS Nano

Volumn 6, Issue 8, 2012, Pages 6969-6976

  Setvín, Martin ^a,b   Mutombo, Pingo ^a   Ondráček, Martin ^a   Majzik, Zsolt ^a   Švec, Martin ^a   Cháb, Vladimír ^a   Ošt'Ádal, Ivan ^b   Sobotík, Pavel ^b   Jelínek, Pavel ^a  

^a INSTITUTE OF PHYSICS   (Czech Republic)

^b CHARLES UNIVERSITY   (Czech Republic)

Author keywords

chains; chemical identification; indium; nc AFM; Si(100); tin

Indexed keywords

AFM; AFM TIP; CHEMICAL IDENTIFICATION; CHEMICAL NATURE; CHEMICAL STATE; DFT CALCULATION; METAL CHAIN; NC-AFM; NON-CONTACT; ROOM TEMPERATURE; SHORT-RANGE FORCES; SI(1 0 0); SI(100) SURFACE; SILICON ATOMS; SINGLE ATOMS;

ATOMS; CHAINS; DENSITY FUNCTIONAL THEORY; INDIUM; SILICON; TIN;

CHEMICAL ANALYSIS;

INDIUM; SILICON; TIN;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL MODEL; CHEMISTRY; COMPUTER SIMULATION; MATERIALS TESTING; METHODOLOGY;

COMPUTER SIMULATION; INDIUM; MATERIALS TESTING; MICROSCOPY, ATOMIC FORCE; MODELS, CHEMICAL; SILICON; TIN;

EID: 84865585205     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn301996k     Document Type: Article

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