High-temperature interaction of Al with Si(1 0 0) surface at low Al coverages

Surface Science

Volumn 506, Issue 1-2, 2002, Pages 80-86

  Kotlyar, V G ^a   Saranin, A A ^a,b,c   Zotov, A V ^a,b,d   Lifshits, V G ^a,c,d   Kubo, O ^b   Ohnishi, H ^b   Katayama, M ^b   Oura, K ^b  

^a INSTITUTE OF AUTOMATION AND CONTROL PROCESSES   (Russian Federation)

^b OSAKA UNIVERSITY   (Japan)

^c FAR EASTERN FEDERAL UNIVERSITY   (Russian Federation)

^d VLADIVOSTOK STATE UNIVERSITY OF ECONOMICS AND SERVICE   (Russian Federation)

Author keywords

Aluminum; Atom solid interactions; Silicon; Surface structure, morphology, roughness, and topography

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; DEFECTS; DIMERS; HIGH TEMPERATURE EFFECTS; INTERFACES (MATERIALS); LOW ENERGY ELECTRON DIFFRACTION; MASS TRANSFER; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SILICON; SUBSTRATES; SURFACE ROUGHNESS; SURFACE STRUCTURE;

MISSING DIMER DEFECTS;

ALUMINUM;

EID: 0037052798     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(01)01768-X     Document Type: Article

References (9)