The complex material properties of chalcopyrite and kesterite thin-film solar cell absorbers tackled by synchrotron-based analytics

Progress in Photovoltaics: Research and Applications

Volumn 20, Issue 5, 2012, Pages 557-567

  Schorr, Susan ^a   Mainz, Roland ^a   Mönig, Harry ^b   Lauermann, Iver ^a   Bär, Marcus ^a  

^a HAHN MEITNER INSTITUT   (Germany)

^b YALE UNIVERSITY   (United States)

Author keywords

chalcopyrites; kesterites; synchrotron based analytics; thin film solar cells

Indexed keywords

ANALYTICAL TECHNIQUES; CHALCOPYRITES; CHARACTERIZATION METHODS; COMPLEX MATERIALS; COMPOUND SEMICONDUCTORS; KESTERITES; MATERIAL CHARACTERISTICS; RECENT PROGRESS; STRUCTURAL PHASE TRANSITION; SYNCHROTRON-BASED ANALYTICS; THIN FILM FORMATION; THIN-FILM SOLAR CELLS;

COPPER COMPOUNDS; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; SOLAR CELLS; STOICHIOMETRY;

NANOSTRUCTURED MATERIALS;

EID: 84864432115     PISSN: 10627995     EISSN: 1099159X     Source Type: Journal    
DOI: 10.1002/pip.1256     Document Type: Article

References (73)

1. 2 by synchrotron radiation. Journal of Crystal Research and Technology 2006; 41: 450-457, DOI 10.1002/crat.200510604.
2. Schorr S, Geandier G, Korzun BV,. Some are different from others: high temperature phase transitions in ternary chalcopyrites. Physica Status Solidi (c) 2006; 3 (8): 2610-2613, DOI: 10.1002/pssc.200669520.
3. Stephan C,. Structural trends in off stoichiometric chalcopyrite type compound semiconductors. PhD Thesis, FU Berlin, 2011, DOI:.
4. Lehmann S,. Vacancy-compounds in the system Cu-Ga-Se: a structural study of bulk- and thin-film material. PhD Thesis, FU Berlin, 2007,.
5. Schorr S, Gonzalez-Aviles G,. In-situ investigation of the structural phase transition in kesterite. Physica Status Solidi a 2009; 206 (5): 1054-1058, DOI: 10.1002/pssa.20088121
6. Schorr S, Weber A, Honkimäki V, Schock H-W,. In-situ investigation of the kesterite formation from binary and ternary sulphides. Thin Solid Films 2009; 517 (2): 2461-2464, DOI: 10.1016/j.tsf.2008.11.053.
7. 2 chalcopyrite semiconductors. Phyical Review B 1983; 27: 5176-5179, DOI: 10.1103/PhysRevB.27.5176.
8. 3. Journal of Crystal Growth 1980; 50: 429-436.
9. 2 single crystals. Solar Cells 1986; 16: 91-100.
10. Rogacheva EI,. Crystal Research and Technology 1996; 3: 1-10.
11. 2 solid solution series. Journal of Alloys and Compounds 2005; 396: 202-207, DOI: 10.1016/j.jallcom.2004.12.018.
12. 1-x and structural relationship between the tetragonal and cubic phase. Journal of Crystal Growth 2005; 283: 356-366, DOI: 10.1016/j.jcrysgro.2005.06.033.
13. 1-x and structural relationship between the tetragonal and cubic phase. Journal of Solid State Chemistry 2005; 178: 3631-3638, DOI: 10.1016/j.jssc.2005.09.003.
14. 2 system. Journal of Solid State Chemistry 2005; 178: 3476-3484, DOI: 10.1016/j.jssc.2005.09.009.
15. 3 quasibinary system. Journal of Materials Science: Materials in Electronics 2005; 16: 25-28.
16. 3 system. Journal of Electronic Materials 1995; 24: 903-906.
17. 1-x solid solutions. Inorganic Materials 2003; 39: 1122-1126.
18. Kokta M, Carruthers JR, Grasso M, Kasper HM, Tell B,. Ternary phase relations in the vicinity of chalcopyrite copper gallium sulfide. Journal of Electronic Materials 1976; 5: 69-89.
19. 2. Journal of Electronic Materials 1981; 10: 541-558.
20. 4 tetrahedral compounds. Progress in Crystal Growth and Characterization 1987; 15: 1-41.
21. Shannon RD,. Structure & Bonding in Crystals, O'Keeffe M, Nawrotsky A, (eds). 1981.
22. Cahen D,. Atomic radii in adamantines. Journal of Physics and Chemistry of Solids 1988; 49: 103-111.
23. Shannon RD,. Acta Crystallographica A. 1976; 32: 751.
24. Ellmer K, Mientus R, Weiss V, Rossner H,. In situ energy-dispersive x-ray diffraction system for time-resolved thin-film growth studies. Measurement Science and Technology 2003; 14: 336-345.
25. von Klopmann C, Djordjevic J, Scheer R,. Real-time studies of phase transformations in Cu-In-Se-S thin films 1: intermetallic phase transformations. Journal of Crystal Growth 2006; 289: 113-120.
26. Rodriguez-Alvarez H, Kötschau I, Schock H,. Pressure-dependent real-time investigations on the rapid thermal sulfurization of Cu-In thin films. Journal of Crystal Growth 2008; 310: 3638-3644, DOI: 10.1016/j.jcrysgro.2008. 05.005
27. 4 thin films. Physica Status Solidi (c) 2009; 6: 1245-1248, DOI: 10.1002/pssc.200881231
28. Mainz R, Klenk R, Lux-Steiner M,. Sulphurisation of gallium-containing thin-film precursors analysed in situ. Thin Solid Films 2007; 515: 5934-5937, DOI: 10.1016/j.tsf.2006.12.167
29. Weber A, Mainz R, Schock HW,. On the Sn loss from thin films of the material system Cu-Zn-Sn-S in high vacuum. Journal of Applied Physics 2010; 107: 013516, DOI: 10.1063/1.3273495
30. Mainz R,. PhD Thesis. Freie Universität Berlin, Germany 2008.
31. Mainz R, Klenk R,. In situ analysis of elemental depth distributions in thin films by combined evaluation of synchrotron X-ray fluorescence and diffraction. Journal of Applied Physics 2011; 109: 123515, DOI: 10.1063/1.3592288
32. 2-films using synchrotron energy dispersive X-ray diffractometry. Solar Energy Materials and Solar Cells 2011; 95: 250-253, DOI: 10.1016/j.solmat.2010.05.007
33. Rodriguez-Alvarez H, Mainz R, Marsen B, Abou-Ras D, Schock HW,. Recrystallization of Cu-In-S thin films studied in situ by energy-dispersive X-ray diffraction. Journal of Applied Crystallography 2010; 43: 1053-1061, DOI: 10.1107/S0021889810025860
34. 2 assisted by metallic Cu or Ag. Journal of Solid State Chemistry 2010; 183: 803-806, DOI: 10.1016/j.jssc.2010.01.023
35. 2 thin films by energy dispersive X-ray diffraction. Thin Solid Films 2011; 519: 7193-7196, DOI: 10.1016/j.tsf.2010.12.229
36. Genzel C, Denks IA, Coelho R, Thomas D, Mainz R, Apel D, Klaus M,. Exploiting the features of energy-dispersive synchrotron diffraction for advanced residual stress and texture analysis. Journal of Strain Analysis 2011; DOI: 10.1177/0309324711403824
37. Genzel C, Denks I, Gibmeier J, Klaus M, Wagener G,. The materials science synchrotron beamline EDDI for energy-dispersive diffraction analysis. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 2007; 578: 23-33, DOI: 10.1016/j.nima.2007.05.209
38. 2 thin films investigated by in-situ energy dispersive x-ray diffraction. Materials Research Society Symposium Proceedings. San Francisco, USA, 2007; 1012: 1012-Y13-09.
39. Rodriguez-Alvarez H, Kötschau I, Schock H,. Pressure-dependent real-time investigations on the rapid thermal sulfurization of Cu-In thin films. Journal of Crystal Growth 2008; 310: 3638-3644, DOI: 10.1016/j.jcrysgro.2008. 05.005
40. Schorr S, Stephan C, Mainz R, Rodriguez-Alvarez H, Tovar M,. Neutrons and photons in materials research for thin film solar cells. Advanced Engineering Materials 2011; 13: 737-741, DOI: 10.1002/adem.201000290
41. Thomas D, Mainz R, Klaer J, Haas S, Klaus M, Genzel C, Schock H-W,. In situ residual stress analysis of molybdenum layers used as back contact in thin film solar cells. To be published.
42. Hauk V,. Structural and Residual Stress Analysis by Nondestructive Methods. Elsevier: Amsterdam, 1997.
43. 2-based solar cell with an open circuit voltage of 879 mV prepared by a rapid thermal process. Solar Energy Materials and Solar Cells 2011; 95: 864-869, DOI: 10.1016/j.solmat.2010.11.003
44. 2 solar modules. Thin Solid Films 2011; 519: 7534-7536, DOI: 10.1016/j.tsf.2011.01.096
45. 2 thin films and related binary selenides. Applied Surface Science 1996; 103: 409-429.
46. 2 heterojunction solar cells-recent achievements, current understanding, and future challenges. Applied Physics A 1999; 69: 131.
47. 2 solar cells. Progress in Photovoltaics 1998; 6: 407-421.
48. 2. Journal of Applied Physics 1993; 73: 2902-2909.
49. 2. European Physics Journal-Applied Physics 1999; 6: 131.
50. 2 on GaAs(110). Journal of Applied Physics 2002; 91: 1978-1983.
51. 2 surface. Applied Physics Letters 2003; 82: 2829-2831.
52. 2 thin films: further experimental evidence for a defect-induced surface reconstruction. Journal of Applied Physics 2010; 107: 113540 and Refs. therein.
53. 2 films: an investigation by hard X-ray photoelectron spectroscopy. Acta Materialia 2009; 57: 3645-3651.
54. 2 thin films. Applied Physics Letters 2008; 93: 244103.
55. 2. Applied Surface Science 2008; 255: 2474-2477.
56. Jaffe JE, Zunger A,. Defect-induced nonpolar-to-polar transition at the surface of chalcopyrite semiconductors. Physical Review B 2001; 64: 241304.
57. 4 as a potential photovoltaic material: a hybrid Hartree-Fock density functional theory study. Physical Review B 2009; 79: 115126.
58. 4 based on first-principle calculation. Japanese Journal of Applied Physics 2009; 48: 090202.
59. 4. Journal of Applied Physics 2010; 107: 053710.
60. Moh GH, Tin-containing mineral systems. part II: phase relations and mineral assemblages in the Cu-Fe-Zn-Sn-S system. Chemie der Erde 1975; 34: 1-61
61. 2 system. Journal of Alloys and Compounds 2004; 368: 135-143.
62. Meisel A, Leonhardt G, Szargan R,. X-Ray Spectra and Chemical Binding. Springer Series in Chemical Physics Vol. 37, Springer: Berlin 1989.
63. Schorr S, Weber A, Honkimäki V, Schock HW,. In-situ investigation of the kesterite formation from binary and ternary sulphides. Thin Solid Films 2009; 517: 2461-2464, DOI: 10.1016/j.tsf.2008.11.053
64. Schorr S,. The crystal structure of kesterite type compounds: a neutron and X-ray diffraction study. Solar Energy Materials and Solar Cells 2011; 95: 1482-1488, DOI: 10.1016/j.solmat.2011.01.002, and Refs. therein
65. 4 thin film solar cells by fast coevaporation. Progress in Photovoltaics: Reearch and Applications. 2011; 19: 93-96, DOI: 10.1002/pip.976.
66. 4 probed by soft x-ray emission and absorption spectroscopy. Physical Review B 2011; 84: 035308.
67. 4 thin films by sulfurization of E-B evaporated precursors. Solar Energy Materials and Solar Cells 1997; 49: 407-414.
68. 4 thin films for photovoltaic applications. Proc. 11th Int. Conf., ICTMC-11. Institute of Physics Conference Series Number 152. Institute of Physics Publishing, Bristol and Philadelphia: Salford, UK, 1998; 152: 345.
69. 4 thin films by hybrid sputtering. Journal of Physics and Chemistry of Solids 2005; 66: 1978-1981, DOI: 10.1016/j.jpcs.2005.09.037
70. 4-based thin film solar cells by using preferential etching technique. Applied Physics Express 2008; 1: 041201, DOI: 10.1143/APEX.1.041201
71. Scragg JJ, Berg DM, Dale PJ,. A 3.2% efficient kesterite device from electrodeposited stacked elemental layers. Journal of Electroanalytical Chemistry 2010; 646: 52-59, DOI: 10.1016/j.jelechem.2010.01.008
72. 4 thin films for a solar cell absorber layer. Semiconducor Science and Technology 2008; 23: 085023, DOI: 10.1088/0268-1242/23/8/085023
73. Todorov TK, Reuter KB, Mitzi DB,. High-efficiency solar cell with earth-abundant liquid-processed absorber. Advanced Materials 2010; 22: E156-E159, DOI: 10.1002/adma.200904155