Recrystallization of Cu-In-S thin films studied in situ by energy-dispersive X-ray diffraction

Journal of Applied Crystallography

Volumn 43, Issue 5 PART 1, 2010, Pages 1053-1061

  Rodriguez Alvarez, Humberto ^a   Mainz, Roland ^a   Marsen, Björn ^a   Abou Ras, Daniel ^a   Schock, Hans Werner ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

energy dispersive X ray diffraction; phase transitions; recrystallization; thin film solar cells

Indexed keywords

BI-LAYER FILMS; CHALCOPYRITE-TYPE; CU-IN-S; DIFFRACTION DATA; DIFFRACTION SPECTRA; ENERGY-DISPERSIVE X-RAY DIFFRACTION; EVOLUTION OF THE MICROSTRUCTURE; IN-SITU; LINE PROFILE ANALYSIS; MATERIAL SYSTEMS; NANOCRYSTALLINE CU; PRESSURE CONDITIONS; REAL TIME; RECRYSTALLIZATION; RECRYSTALLIZATIONS; SOLID-STATE PHASE TRANSITION; THIN-FILM SOLAR CELLS;

COPPER COMPOUNDS; DIFFRACTION; GRAIN GROWTH; GRAIN SIZE AND SHAPE; PHASE TRANSITIONS; RECRYSTALLIZATION (METALLURGY); SOLAR CELLS; SOLAR ENERGY; SULFUR; THIN FILMS; X RAY DIFFRACTION; X RAYS;

COPPER;

EID: 77957361897     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889810025860     Document Type: Article

References (24)

1. Abou-Ras, D., Schorr, S. & Schock, H. W. (2007). J. Appl. Cryst. 40, 841-848.
2. Bodnar, I. V. & Orlova, N. S. (1983). Phys. Status Solidi A, 78, k59-k63.
3. Coats, A. W. & Redfern, J. P. (1964). Nature (London), 201, 68-70.
4. Delhez, R., de Keijser, T. H. & Mittemeijer, E. J. (1982). Fresenius Z. Anal. Chem. 312, 1-17.
5. Genzel, C., Denks, I. A., Gibmeier, J., Klaus, M. & Wagener, G. (2007). Nucl. Instrum. Methods Phys. Res. Sect. A, 578, 23-33.
6. Gerward, L., Mørup, S. & Topsøe, H. (1975). J. Appl. Phys. 47, 822-825.
7. Guo, Q., Ford, G. M., Hillhouse, H. W. & Agrawal, R. (2009). Nano Lett. pp. 462-465.
8. Hahn, T., Cieslak, J., Metzner, H., Eberhardt, J., Reisloehner, U., Gossla, M., Witthuhn, W. & Kraeusslich, J. (2006). Appl. Phys. Lett. 88, 171915-171918.
9. Kraus, W. & Nolze, G. (1996). J. Appl. Cryst. 29, 301-303.
10. Krunks, M., Mikli, V., Bijakina, O. & Mellikov, E. (1999). Appl. Surf. Sci. 142, 356-361.
11. Lotgering, F. K. (1959). J. Inorg. Nucl. Chem. 9, 113-123.
12. Otto, J. W. (1997). J. Appl. Cryst. 30, 1008-1015.
13. Pareek, V. K., Ramanarayanan, T. A., Ling, S. & Mumford, J. D. (1994). Solid State Ionics, 74, 263-269.
14. Rau, H. (1967). J. Phys. Chem. Solids, 28, 903-917.
15. Rau, H. (1974). J. Phys. Chem. Solids, 35, 1415-1424.
16. Rodriguez-Alvarez, H., Koetschau, I. M., Genzel, C. & Schock, H. W. (2009). Thin Solid Films, 517, 2140-2144.
17. Rodriguez-Alvarez, H., Koetschau, I. M. & Schock, H. W. (2008). J. Cryst. Growth, 310, 3638-3644.
18. Rodriguez-Alvarez, H., Mainz, R., Weber, A., Marsen, B. & Schock, H.-W. (2009). Proceedings of the Materials Research Society Spring Meeting, San Francisco, 13-17 April 2009, Symposium M, 1165-M02-07. San Francisco: MRS Press.
19. Schlenker, T., Luis Valero, M., Schock, H. W. & Werner, J. H. (2004). J. Cryst. Growth, 264, 178-184.
20. Schoeldstroem, J., Kessler, J. & Edoff, M. (2005). Thin Solid Films, 480, 61-66.
21. Thompson, C. V. (1985). J. Appl. Phys. 58, 763-772.
22. Thompson, C. V. (1990). Annu. Rev. Mater. Res. 20, 245-269.
23. Volobujeva, O., Kois, J., Traksmaa, R., Muska, K., Bereznev, S., Grossberg, M. & Mellikov, E. (2008). Thin Solid Films, 516, 7105-7109.
24. Wissmann, S. & Becker, K. D. (1997). Solid State Ionics, 101-103, 539-545.