Surface Cu-depletion of Cu(In,Ga)Se2 thin films: Further experimental evidence for a defect-induced surface reconstruction

Journal of Applied Physics

Volumn 107, Issue 11, 2010, Pages

  Monig H ^a,b   Fischer, Ch H ^a,c   Grimm, A ^a   Johnson, B ^a   Kaufmann, C A ^a   Caballero, R ^a   Lauermann, I ^a   Lux Steiner, M Ch ^a,c  

^a HAHN MEITNER INSTITUT   (Germany)

^b YALE UNIVERSITY   (United States)

^c FREIE UNIVERSITÄT BERLIN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE DEPENDENCE; ANGLE-DEPENDENT; CHALCOPYRITE THIN FILMS; COMPOSITIONAL ANALYSIS; CU(IN , GA)SE; DEPTH PROFILE; DEVICE PHYSICS; EXPERIMENTAL DATA; EXPERIMENTAL EVIDENCE; FIRST-PRINCIPLES CALCULATION; HARD X-RAY PHOTOELECTRON SPECTROSCOPY; INTERFACE PROPERTY; SECONDARY NEUTRAL MASS SPECTROSCOPY; SOFT X RAY EMISSION SPECTROSCOPY; SUBNANOMETERS; SURFACE LAYERS; THIN SURFACE LAYER;

COPPER; COPPER COMPOUNDS; EMISSION SPECTROSCOPY; GALLIUM; MASS SPECTROMETRY; MOLECULAR ORBITALS; SEMICONDUCTING SELENIUM COMPOUNDS; SURFACES; THIN FILMS; TOOLS; VAPOR DEPOSITION; X RAY PHOTOELECTRON SPECTROSCOPY;

SURFACE RECONSTRUCTION;

EID: 77953634398     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3427539     Document Type: Review

References (27)

1. I. Repins, M. A. Contreras, B. Egaas, C. DeHart, J. Scharf, C. L. Perkins, B. To, and R. Noufi, Prog. Photovoltaics PPHOED 1062-7995 16, 235 (2008). 10.1002/pip.822
2. D. Schmid, M. Ruckh, F. Grunwald, and H. W. Schock, J. Appl. Phys. JAPIAU 0021-8979 73, 2902 (1993). 10.1063/1.353020
3. R. Herberholz, U. Rau, H. W. Schock, T. Haalboom, T. Gödecke, F. Ernst, C. Beilharz, K. W. Benz, and D. Cahen, Eur. Phys. J.: Appl. Phys. EPAPFV 1286-0042 6, 131 (1999). 10.1051/epjap:1999162
4. D. Liao and A. Rockett, J. Appl. Phys. JAPIAU 0021-8979 91, 1978 (2002). 10.1063/1.1434549 (Pubitemid 34167718)
5. D. Liao and A. Rockett, Appl. Phys. Lett. APPLAB 0003-6951 82, 2829 (2003). 10.1063/1.1570516
6. H. Mönig, C. -H. Fischer, R. Caballero, C. A. Kaufmann, N. Allsop, M. Gorgoi, R. Klenk, H. -W. Schock, S. Lehmann, M. C. Lux-Steiner, and I. Lauermann, Acta Mater. ACMAFD 1359-6454 57, 3645 (2009). 10.1016/j.actamat.2009. 04.029
7. J. E. Jaffe and A. Zunger, Phys. Rev. B PRBMDO 0163-1829 64, 241304 (2001). 10.1103/PhysRevB.64.241304
8. H. Dittrich and H. -W. Schock, Springer Proceedings in Physics (Springer-Verlag, Berlin, 1991), Vol. 54, p. 432.
9. I. M. Kötschau and H. W. Schock, J. Phys. Chem. Solids JPCSAW 0022-3697 64, 1559 (2003). 10.1016/S0022-3697(03)00074-X
10. H. Mönig, Ph.D. thesis, Freie Universität Berlin, (2009).
11. H. Mönig, I. Lauermann, A. Grimm, C. Camus, C. A. Kaufmann, P. Pistor, C. Jung, T. Kropp, M. C. Lux-Steiner, and C. -H. Fischer, Appl. Surf. Sci. ASUSEE 0169-4332 255, 2474 (2008). 10.1016/j.apsusc.2008.07.177
12. R. Tertian and F. Claisse, Principles of Quantitative X-Ray Fluorescence Analysis (Heyden, Philadelphia, 1982), pp. 56-69.
13. I. M. Kötschau, Ph.D. thesis, Universität Stuttgart, (2003).
14. B. L. Henke, E. M. Gullikson, and J. C. Davis, At. Data. Nucl. Data Tables 54, 181 (1993). 10.1006/adnd.1993.1013
15. J. Nordgren and J. Guo, J. Electron Spectrosc. Relat. Phenom. JESRAW 0368-2048 110-111, 1 (2000). 10.1016/S0368-2048(00)00154-7
16. All spectra of this study were recorded in second diffraction order of the grating with the specifications: grating curve radius: 5 m; blaze angle: 0.8506°; incident angle: 2.6°; line distance: 2.51 μm.
17. C. A. Kaufmann, T. Unold, D. Abou-Ras, J. Bundesmann, A. Neisser, R. Klenk, R. Scheer, K. Sakurai, and H. -W. Schock, Thin Solid Films THSFAP 0040-6090 515, 6217 (2007). 10.1016/j.tsf.2006.12.095 (Pubitemid 46635666)
18. A. M. Gabor, J. R. Tuttle, D. S. Albin, M. A. Contreras, and R. Noufi, Appl. Phys. Lett. APPLAB 0003-6951 65, 198 (1994). 10.1063/1.112670
19. R. Klenk, T. Walter, H. -W. Schock, and D. Cahen, Adv. Mater. ADVMEW 0935-9648 5, 114 (1993). 10.1002/adma.19930050209
20. I. Lauermann, C. Loreck, A. Grimm, R. Klenk, H. Mönig, M. C. Lux-Steiner, C. -H. Fischer, S. Visbeck, and T. P. Niesen, Thin Solid Films THSFAP 0040-6090 515, 6015 (2007). 10.1016/j.tsf.2006.12.172 (Pubitemid 46656390)
21. i (x) the elemental density (calculated following Ref.). The elemental absorption coefficients have been taken from Ref..
22. The information depth is considered as the depth normal to the surface, from which 95% of the detected signal originates. It has been calculated for the Cu-L line (see also Ref.).
23. S. B. Zhang, S. H. Wei, and A. Zunger, Phys. Rev. Lett. PRLTAO 0031-9007 78, 4059 (1997). 10.1103/PhysRevLett.78.4059
24. A. Niemegeers, M. Burgelman, R. Herberholz, U. Rau, D. Hariskos, and H. -W. Schock, Prog. Photovoltaics PPHOED 1062-7995 6, 407 (1998). 10.1002/(SICI)1099-159X(199811/12)6:6<407::AID-PIP2303.0.CO;2-U
25. Note that the cover layers used in Ref. widely follow the surface morphology of the CIGSe substrates, which provides the basis for the analysis of roughness effects on relative x-ray emission intensities.
26. C. A. Kaufmann, R. Caballero, T. Unold, R. Hesse, R. Klenk, S. Schorr, M. Nichterwitz, and H. -W. Schock, Sol. Energy Mater. Sol. Cells SEMCEQ 0927-0248 93, 859 (2009). 10.1016/j.solmat.2008.10.009
27. S. B. Zhang and S. -H. Wei, Phys. Rev. B PRBMDO 0163-1829 65, 081402 (2002). 10.1103/PhysRevB.65.081402