The materials science synchrotron beamline EDDI for energy-dispersive diffraction analysis

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 578, Issue 1, 2007, Pages 23-33

  Genzel, Ch ^a   Denks, I A ^a   Gibmeier, J ^a   Klaus, M ^a   Wagener, G ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

Energy dispersive mode; Residual stress analysis; X ray diffraction

Indexed keywords

DATA PROCESSING; IN SITU PROCESSING; PHOTONS; POLYCRYSTALLINE MATERIALS; RESIDUAL STRESSES; SUPERCONDUCTING MATERIALS; THIN FILMS; X RAY DIFFRACTION;

ENERGY DISPERSIVE DIFFRACTION; HIGH ENERGY WHITE PHOTON BEAM; PHOTON FLUX; RESIDUAL STRESS ANALYSIS;

SYNCHROTRON RADIATION;

EID: 34347348294     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2007.05.209     Document Type: Article

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