Examination of growth kinetics of copper rich Cu(In,Ga)Se2-films using synchrotron energy dispersive X-ray diffractometry

Solar Energy Materials and Solar Cells

Volumn 95, Issue 1, 2011, Pages 250-253

  Rissom, Thorsten ^a   Mainz, Roland ^a   Kaufmann, Christian A ^a   Caballero, Raquel ^a   Efimova, Varvara ^b   Hoffmann, Volker ^b   Schock, Hans Werner ^a  

^a HAHN MEITNER INSTITUT   (Germany)

^b IFW DRESDEN   (Germany)

Author keywords

Chalcopyrite; CIGSe; EDXRD; GD OES; In situ; Solar cells

Indexed keywords

CHALCOPYRITE; CIGSE; EDXRD; GD OES; IN-SITU;

COPPER; COPPER COMPOUNDS; DIFFRACTION; EMISSION SPECTROSCOPY; GALLIUM; GLOW DISCHARGES; GROWTH KINETICS; INDIUM; OPTICAL EMISSION SPECTROSCOPY; PHYSICAL VAPOR DEPOSITION; SOLAR CELLS; STOICHIOMETRY; SYNCHROTRONS; X RAY DIFFRACTION ANALYSIS;

IN SITU PROCESSING;

EID: 78149357384     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2010.05.007     Document Type: Conference Paper

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