Controlled variation of the information depth by angle dependent soft X-ray emission spectroscopy: A study on polycrystalline Cu(In,Ga)Se 2

Applied Surface Science

Volumn 255, Issue 5 PART 1, 2008, Pages 2474-2477

  Monig H ^a   Lauermann, I ^b   Grimm, A ^b   Camus, C ^b   Kaufmann, C A ^b   Pistor, P ^b   Jung, Ch ^b   Kropp, T ^b   Lux Steiner, M C ^a,b   Fischer, Ch H ^a,b  

^a FREIE UNIVERSITÄT BERLIN   (Germany)

^b HAHN MEITNER INSTITUT   (Germany)

Author keywords

Cu(In,Ga)Se 2; Information depth; Soft X ray emission spectroscopy; Synchrotron

Indexed keywords

CADMIUM SULFIDE; ELECTROMAGNETIC WAVE EMISSION; EMISSION SPECTROSCOPY; II-VI SEMICONDUCTORS; SYNCHROTRONS; THIN FILM SOLAR CELLS; X RAY SCATTERING; ZINC COMPOUNDS;

ABSORPTION AND EMISSIONS; COMPOSITION ANALYSIS; CU(IN , GA)SE2; HOMOGENEOUS DISTRIBUTION; INFORMATION DEPTH; POLYCRYSTALLINE THIN FILM; SOFT X RAY EMISSION SPECTROSCOPY; X RAY EMISSION SPECTROSCOPY;

X RAYS;

EID: 56949086014     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.07.177     Document Type: Article

References (14)

1. Rau U., and Schock H.W. Appl. Phys. A 69 (1999) 131-147
2. Heske C., Eich D., Fink R., Umbach E., van Buuren T., Bostedt C., Terminello L.J., Kakar S., Grush M.M., Callcott T.A., Himpsel F.J., Ederer D.L., Perera R.C.C., Riedl W., and Karg F. Appl. Phys. Lett. 74 (1999) 1451
3. Heske C., Eich D., Fink R., Umbach E., van Buuren T., Bostedt C., Terminello L.J., Kakar S., Grush M.M., Callcott T.A., Himpsel F.J., Ederer D.L., Perera R.C.C., Riedl W., and Karg F. Appl. Phys. Lett. 75 (1999) 2082
4. Weinhardt L., Blum M., Bär M., Heske C., Fuchs O., Umbach E., Denlinger J.D., Ramanathan K., and Noufi R. Thin Solid Films 515 (2007) 6119
5. Gloeckler M., and Sites J.R. J. Phys. Chem. Sol. 66 (2005) 1891-1894
6. Tertian R., and Claisse F. Principles of Quantitative X-Ray Fluorescence Analysis (1982), Heyden Publishing, Philadelphia p. 51
7. Kaufmann C.A., Unold T., Abou-Ras D., Bundesmann J., Neisser A., Klenk R., Scheer R., Sakurai K., and Schock H.-W. Thin Solid Films 515 (2007) 6217
8. Ennaoui A., Bär M., Klaer J., Saéz-Araoz R., and Lux-Steiner M.Ch. Progr. Photovolt: Res. Appl. 14 (2006) 499-511
9. B.L. Henke, E.M. Gullikson, J.C. Davis, Atomic Data And Nuclear Data Tables 54, 181-342 (1993), (http://www.cxro.lbl.gov/optical constants/atten2.html).
10. Standard E 673-98, Annual Book of ASTM Standards 2001 (ASTM, West Conshohocken, Pennsylvania, 2001), vol. 3.06, p. 735.
11. C.A. Kaufmann, R. Caballero, T. Unold, R. Hesse, R. Klenk, S. Schorr, M. Nichterwitz, H.-W. Schock, 17th Int. Photovolt. Sci. Eng. Conf. (PVSEC-17), Fukuoka, (2007).
12. Niemegeers A., Burgelmann M., Herberholz R., Rau U., Hariskos D., and Schock H.-W. Progr. Photovolt. Res. Appl. 6 (1998) 407-421
13. Kötschau I.M., and Schock H.W. J. Phys. Chem. Solids 64 (2003) 1559-1563
14. Han S.-H., Hasoon F.S., Hermann A.M., and Levi D.H. Appl. Phys. Lett. 91 (2007) 021904