Sulphurisation of gallium-containing thin-film precursors analysed in-situ

Thin Solid Films

Volumn 515, Issue 15 SPEC. ISS., 2007, Pages 5934-5937

  Mainz, R ^b   Klenk, R ^b   Lux Steiner, M Ch ^a,b  

^a FREIE UNIVERSITÄT BERLIN   (Germany)

^b HAHN MEITNER INSTITUT   (Germany)

Author keywords

Chalcopyrite; Cu(In,Ga)S2; Energy dispersive XRD; Gallium; Solar cell

Indexed keywords

ADHESION; ENERGY DISPERSIVE X RAY ANALYSIS; MAGNETRON SPUTTERING; SOLAR CELLS; X RAY DIFFRACTION ANALYSIS;

CHALCOPYRITE; PHASE FORMATION; SULPHURIZATION;

THIN FILMS;

EID: 34247326371     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.12.167     Document Type: Article

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