Surface Cu depletion of Cu(In,Ga)Se2 films: An investigation by hard X-ray photoelectron spectroscopy

Acta Materialia

Volumn 57, Issue 12, 2009, Pages 3645-3651

  Monig H ^a,b   Fischer, Ch H ^a,b   Caballero, R ^b   Kaufmann, C A ^b   Allsop, N ^b   Gorgoi, M ^b   Klenk, R ^b   Schock, H W ^b   Lehmann, S ^b   Lux Steiner, M C ^a,b   Lauermann, I ^b  

^a FREIE UNIVERSITÄT BERLIN   (Germany)

^b HAHN MEITNER INSTITUT   (Germany)

Author keywords

Chalcopyrite thin films; Cu depletion; Hard X ray photoelectron spectroscopy; Interface defects; Surface energy

Indexed keywords

CHALCOPYRITE THIN FILMS; CU DEPLETION; HARD X-RAY PHOTOELECTRON SPECTROSCOPY; INTERFACE DEFECTS; SURFACE ENERGY;

COPPER; COPPER COMPOUNDS; ELECTRON SPECTROSCOPY; GALLIUM; INTERFACIAL ENERGY; MOLECULAR ORBITALS; PHOTOELECTRICITY; PHOTOELECTRONS; PHOTOIONIZATION; PHOTONS; RESTORATION; SEMICONDUCTING SELENIUM COMPOUNDS; SINGLE CRYSTAL SURFACES; SOLAR ENERGY; SPECTRUM ANALYSIS; SURFACE ANALYSIS; SURFACE CHEMISTRY; SURFACE DEFECTS; SURFACE MORPHOLOGY; SURFACE RECONSTRUCTION; SURFACE TENSION; THIN FILMS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 65849245739     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2009.04.029     Document Type: Article

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