Exploiting the features of energy-dispersive synchrotron diffraction for advanced residual stress and texture analysis

Journal of Strain Analysis for Engineering Design

Volumn 46, Issue 7, 2011, Pages 615-625

  Genzel, Ch ^a   Denks, I A ^b   Coelho, R ^c   Thomas, D ^a   Mainz, R ^a   Apel, D ^a   Klaus, M ^a  

^a HAHN MEITNER INSTITUT   (Germany)

^b SALZGITTER MANNESMANN FORSCHUNG GMBH   (Germany)

^c TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

Depth profiling; Energy dispersive diffraction; In situ thinfilm characterization; Residual stress; Texture

Indexed keywords

BEAM LINES; DIFFRACTED BEAMS; ELEVATED TEMPERATURE; ENERGY-DISPERSIVE DIFFRACTION; EXTERNAL LOADS; HIGH ENERGY; HIGH SPATIAL RESOLUTION; IN-SITU; IN-SITU STUDY; MICROSTRUCTURE ANALYSIS; NOVEL METHODS; OUT-OF-PLANE DIFFRACTION; REAL-SPACE; RESIDUAL STRAINS; SCATTERING ANGLES; STRESS EVOLUTION; SYNCHROTRON DIFFRACTION; TEXTURE ANALYSIS;

CHARACTERIZATION; DEPTH PROFILING; POLYCRYSTALLINE MATERIALS; RESIDUAL STRESSES; STRAIN MEASUREMENT; SYNCHROTRON RADIATION; SYNCHROTRONS; TEXTURES;

DIFFRACTION;

EID: 81455148210     PISSN: 03093247     EISSN: 20413130     Source Type: Journal    
DOI: 10.1177/0309324711403824     Document Type: Article

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