In-situ studies of the recrystallization process of CuInS2 thin films by energy dispersive X-ray diffraction

Thin Solid Films

Volumn 519, Issue 21, 2011, Pages 7193-7196

  Thomas, D ^a   Mainz, R ^a   Rodriguez Alvarez, H ^a   Marsen, B ^a   Abou Ras, D ^a   Klaus, M ^a   Genzel, Ch ^a   Schock, H W ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

Chalcopyrite; EDXRD; Grain growth; Profile analysis

Indexed keywords

CHALCOPYRITE; CU-POOR; DIFFRACTION LINES; EDXRD; ELECTRON BACK SCATTER DIFFRACTION; ENERGY DISPERSIVE X RAY SPECTROSCOPY; ENERGY DISPERSIVE X-RAY DIFFRACTIONS; EX SITU; GRAIN SIZE; GROWTH MECHANISMS; IN-SITU; IN-SITU MONITORING; IN-SITU STUDY; PROFILE ANALYSIS; RECRYSTALLIZATION PROCESS; VACUUM CHAMBERS;

COPPER; COPPER COMPOUNDS; DIFFRACTION; FILM GROWTH; GRAIN SIZE AND SHAPE; MEASUREMENT THEORY; RECRYSTALLIZATION (METALLURGY); SYNCHROTRON RADIATION; SYNCHROTRONS; THIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; X RAY SPECTROSCOPY;

GRAIN GROWTH;

EID: 80052155517     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.12.229     Document Type: Conference Paper

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