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Volumn 30, Issue 3, 2012, Pages

Influence of ionization degree on film properties when using high power impulse magnetron sputtering

Author keywords

[No Author keywords available]

Indexed keywords

AVERAGE POWER; CHROMIUM THIN FILMS; DEGREE OF IONIZATION; DEPOSITION FLUXES; DEPOSITION TECHNIQUE; DIRECT CURRENT MAGNETRON SPUTTERING; FILM PROPERTIES; HIGH POWER IMPULSE MAGNETRON SPUTTERING (HIPIMS); INDUSTRIAL DEPOSITION SYSTEMS; ION ENERGY DISTRIBUTION FUNCTIONS; IONIZATION DEGREE; POWER FRACTION; TOTAL POWER;

EID: 84864236404     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.3700227     Document Type: Article
Times cited : (37)

References (29)
  • 4
    • 77956448048 scopus 로고    scopus 로고
    • 10.1016/j.vacuum.2009.12.022
    • J. T. Gudmundsson, Vacuum 84, 1360 (2010). 10.1016/j.vacuum.2009.12.022
    • (2010) Vacuum , vol.84 , pp. 1360
    • Gudmundsson, J.T.1
  • 19
    • 77953163625 scopus 로고    scopus 로고
    • 10.1016/j.tsf.2009.10.145
    • A. Anders, Thin Solid Films 518, 4087 (2010). 10.1016/j.tsf.2009.10.145
    • (2010) Thin Solid Films , vol.518 , pp. 4087
    • Anders, A.1
  • 24
    • 84864201195 scopus 로고    scopus 로고
    • U. S. Patent US2007/0084401 A1 (11 November)
    • H. Ljungcrantz and T. Rosell, U. S. Patent US2007/0084401 A1 (11 November 2003).
    • (2003)
    • Ljungcrantz, H.1    Rosell, T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.