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Volumn 205, Issue 3, 1999, Pages 441-452
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Application of rate equations to describe nucleation and growth on rough substrates: tin and lead on aluminium
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM;
ATOMIC FORCE MICROSCOPY;
LEAD;
MAGNETRON SPUTTERING;
NUCLEATION;
REACTION KINETICS;
SURFACE ROUGHNESS;
THIN FILMS;
TIN;
VAPOR DEPOSITION;
KINETICS OF GROWTH;
KINETICS OF NUCLEATION;
RATE EQUATIONS;
CRYSTAL GROWTH;
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EID: 0032598129
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(99)00291-2 Document Type: Article |
Times cited : (15)
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References (20)
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