-
4
-
-
33846061249
-
-
Cheng, H.-C.; Chen, C.-F.; Tsay, C.-Y. Appl. Phys. Lett. 2007, 90 (1) 012113-3
-
(2007)
Appl. Phys. Lett.
, vol.90
, Issue.1
, pp. 012113-3
-
-
Cheng, H.-C.1
Chen, C.-F.2
Tsay, C.-Y.3
-
5
-
-
33745193944
-
-
Ryu, Y.; Lee, T.-S.; Lubguban, J. A.; White, H. W.; Kim, B.-J.; Park, Y.-S.; Youn, C.-J. Appl. Phys. Lett. 2006, 88 (24) 241108-3
-
(2006)
Appl. Phys. Lett.
, vol.88
, Issue.24
, pp. 241108-3
-
-
Ryu, Y.1
Lee, T.-S.2
Lubguban, J.A.3
White, H.W.4
Kim, B.-J.5
Park, Y.-S.6
Youn, C.-J.7
-
8
-
-
71849104998
-
-
Mourey, D. A.; Park, S. K.; Zhao, D. L. A.; Sun, J.; Li, Y. Y. V.; Subramanian, S.; Nelson, S. F.; Levy, D. H.; Anthony, J. E.; Jackson, T. N. Org. Electron. 2009, 10 (8) 1632-1635
-
(2009)
Org. Electron.
, vol.10
, Issue.8
, pp. 1632-1635
-
-
Mourey, D.A.1
Park, S.K.2
Zhao, D.L.A.3
Sun, J.4
Li, Y.Y.V.5
Subramanian, S.6
Nelson, S.F.7
Levy, D.H.8
Anthony, J.E.9
Jackson, T.N.10
-
9
-
-
0031197973
-
-
Ohyama, M.; Kouzuka, H.; Yoko, T. Thin Solid Films 1997, 306 (1) 78-85
-
(1997)
Thin Solid Films
, vol.306
, Issue.1
, pp. 78-85
-
-
Ohyama, M.1
Kouzuka, H.2
Yoko, T.3
-
10
-
-
77953686048
-
-
Ozgur, U.; Hofstetter, D.; Morkoc, H. Proc. IEEE 2010, 98 (7) 1255-1268
-
(2010)
Proc. IEEE
, vol.98
, Issue.7
, pp. 1255-1268
-
-
Ozgur, U.1
Hofstetter, D.2
Morkoc, H.3
-
11
-
-
48249117996
-
-
Park, J. S.; Jeong, J. K.; Mo, Y. G.; Kim, H. D.; Kim, C. J. Appl. Phys. Lett. 2008, 93 (3).
-
(2008)
Appl. Phys. Lett.
, vol.93
, Issue.3
-
-
Park, J.S.1
Jeong, J.K.2
Mo, Y.G.3
Kim, H.D.4
Kim, C.J.5
-
12
-
-
77955304446
-
-
Moon, Y. K.; Moon, D. Y.; Lee, S.; Park, J. W. Nucl. Instrum. Methods Phys. Res., Sect. B 2010, 268 (16) 2522-2526
-
(2010)
Nucl. Instrum. Methods Phys. Res., Sect. B
, vol.268
, Issue.16
, pp. 2522-2526
-
-
Moon, Y.K.1
Moon, D.Y.2
Lee, S.3
Park, J.W.4
-
14
-
-
84859122403
-
-
Remashan, K.; Choi, Y. S.; Park, S. J.; Jang, J. H. Jpn. J. Appl. Phys. 2011, 50 (4).
-
(2011)
Jpn. J. Appl. Phys.
, vol.50
, Issue.4
-
-
Remashan, K.1
Choi, Y.S.2
Park, S.J.3
Jang, J.H.4
-
15
-
-
80052016079
-
-
Trinh, T. T.; Nguyen, V. D.; Ryu, K.; Jang, K.; Lee, W.; Baek, S.; Raja, J.; Yi, J. Semicond. Sci. Technol. 2011, 26 (8).
-
(2011)
Semicond. Sci. Technol.
, vol.26
, Issue.8
-
-
Trinh, T.T.1
Nguyen, V.D.2
Ryu, K.3
Jang, K.4
Lee, W.5
Baek, S.6
Raja, J.7
Yi, J.8
-
16
-
-
49749123066
-
-
Moon, Y. K.; Moon, D. Y.; Lee, S.; Lee, S. H.; Park, J. W.; Jeong, C. O. J. Vac. Sci. Technol. B 2008, 26 (4) 1472-1476
-
(2008)
J. Vac. Sci. Technol. B
, vol.26
, Issue.4
, pp. 1472-1476
-
-
Moon, Y.K.1
Moon, D.Y.2
Lee, S.3
Lee, S.H.4
Park, J.W.5
Jeong, C.O.6
-
18
-
-
51849127362
-
-
Zhu, J.; Chen, H.; Saraf, G.; Duan, Z.; Lu, Y.; Hsu, S. T. J. Electron. Mater. 2008, 37 (9) 1237-1240
-
(2008)
J. Electron. Mater.
, vol.37
, Issue.9
, pp. 1237-1240
-
-
Zhu, J.1
Chen, H.2
Saraf, G.3
Duan, Z.4
Lu, Y.5
Hsu, S.T.6
-
19
-
-
77958176280
-
-
Ponce, M. A.; Ramirez, M. A.; Parra, R.; Malagù, C; Castro, M. C.; Bueno, P. R.; Varela, J. A. J. Appl. Phys. 2010, 108 (7) 074505
-
(2010)
J. Appl. Phys.
, vol.108
, Issue.7
, pp. 074505
-
-
Ponce, M.A.1
Ramirez, M.A.2
Parra, R.3
Malagù, C.4
Castro, M.C.5
Bueno, P.R.6
Varela, J.A.7
-
20
-
-
61549131929
-
-
Li, C. S.; Li, Y. N.; Wu, Y. L.; Ong, B. S.; Loutfy, R. O. J. Mater. Chem. 2009, 19 (11) 1626-1634
-
(2009)
J. Mater. Chem.
, vol.19
, Issue.11
, pp. 1626-1634
-
-
Li, C.S.1
Li, Y.N.2
Wu, Y.L.3
Ong, B.S.4
Loutfy, R.O.5
-
21
-
-
25144514971
-
-
Kim, Y. S.; Tai, W. P.; Shu, S. J. Thin Solid Films 2005, 491 (1-2) 153-160
-
(2005)
Thin Solid Films
, vol.491
, Issue.1-2
, pp. 153-160
-
-
Kim, Y.S.1
Tai, W.P.2
Shu, S.J.3
-
22
-
-
33645894990
-
-
Wang, M. R.; Wang, J.; Chen, W.; Cui, Y.; Wang, L. D. Mater. Chem. Phys. 2006, 97 (2-3) 219-225
-
(2006)
Mater. Chem. Phys.
, vol.97
, Issue.2-3
, pp. 219-225
-
-
Wang, M.R.1
Wang, J.2
Chen, W.3
Cui, Y.4
Wang, L.D.5
-
23
-
-
26444557375
-
-
Ghosh, R.; Paul, G. K.; Basak, D. Mater. Res. Bull. 2005, 40 (11) 1905-1914
-
(2005)
Mater. Res. Bull.
, vol.40
, Issue.11
, pp. 1905-1914
-
-
Ghosh, R.1
Paul, G.K.2
Basak, D.3
-
24
-
-
55049127992
-
-
Castanedo-Perez, R.; Jimenez-Sandoval, O.; Jimenez-Sandoval, S.; Marquez-Marin, J.; Mendoza-Galvan, A.; Torres-Delgado, G.; Maldonado-Alvarez, A. J. Vac. Sci. Technol. A 1999, 17 (4) 1811-1816
-
(1999)
J. Vac. Sci. Technol. A
, vol.17
, Issue.4
, pp. 1811-1816
-
-
Castanedo-Perez, R.1
Jimenez-Sandoval, O.2
Jimenez-Sandoval, S.3
Marquez-Marin, J.4
Mendoza-Galvan, A.5
Torres-Delgado, G.6
Maldonado-Alvarez, A.7
-
25
-
-
33748437658
-
-
Wang, M.; Kim, E. J.; Chung, J. S.; Shin, E. W.; Hahn, S. H.; Lee, K. E.; Park, C. Phys. Status Solidi A 2006, 203 (10) 2418-2425
-
(2006)
Phys. Status Solidi A
, vol.203
, Issue.10
, pp. 2418-2425
-
-
Wang, M.1
Kim, E.J.2
Chung, J.S.3
Shin, E.W.4
Hahn, S.H.5
Lee, K.E.6
Park, C.7
-
26
-
-
38649124037
-
-
Srinivasan, G.; Gopalakrishnan, N.; Yu, Y. S.; Kesavamoorthy, R.; Kumar, J. Superlattices Microstruct. 2008, 43 (2) 112-119
-
(2008)
Superlattices Microstruct.
, vol.43
, Issue.2
, pp. 112-119
-
-
Srinivasan, G.1
Gopalakrishnan, N.2
Yu, Y.S.3
Kesavamoorthy, R.4
Kumar, J.5
-
27
-
-
34848832131
-
-
Bahadur, H.; Srivastava, A. K.; Sharma, R. K.; Chandra, S. Nanoscale Res. Lett. 2007, 2 (10) 469-475
-
(2007)
Nanoscale Res. Lett.
, vol.2
, Issue.10
, pp. 469-475
-
-
Bahadur, H.1
Srivastava, A.K.2
Sharma, R.K.3
Chandra, S.4
-
28
-
-
38949090386
-
-
Dutta, M.; Mridha, S.; Basak, D. Appl. Surf. Sci. 2008, 254 (9) 2743-2747
-
(2008)
Appl. Surf. Sci.
, vol.254
, Issue.9
, pp. 2743-2747
-
-
Dutta, M.1
Mridha, S.2
Basak, D.3
-
29
-
-
0025751968
-
-
Jones, A. C.; Wright, P. J.; Cockayne, B. J. Cryst. Growth 1991, 107 (1-4) 297-308
-
(1991)
J. Cryst. Growth
, vol.107
, Issue.1-4
, pp. 297-308
-
-
Jones, A.C.1
Wright, P.J.2
Cockayne, B.3
-
30
-
-
33947251640
-
-
Ong, B. S.; Li, C. S.; Li, Y. N.; Wu, Y. L.; Loutfy, R. J. Am. Chem. Soc. 2007, 129 (10) 2750
-
(2007)
J. Am. Chem. Soc.
, vol.129
, Issue.10
, pp. 2750
-
-
Ong, B.S.1
Li, C.S.2
Li, Y.N.3
Wu, Y.L.4
Loutfy, R.5
-
32
-
-
53349162378
-
-
Yoon, S. H.; Liu, D.; Shen, D. N.; Park, M.; Kim, D. J. J. Mater. Sci. 2008, 43 (18) 6177-6181
-
(2008)
J. Mater. Sci.
, vol.43
, Issue.18
, pp. 6177-6181
-
-
Yoon, S.H.1
Liu, D.2
Shen, D.N.3
Park, M.4
Kim, D.J.5
-
33
-
-
44049083453
-
-
Frenzel, H.; Lajn, A.; Brandt, M.; von Wenckstern, H.; Biehne, G.; Hochmuth, H.; Lorenz, M.; Grundmann, M. Appl. Phys. Lett. 2008, 92 (19).
-
(2008)
Appl. Phys. Lett.
, vol.92
, Issue.19
-
-
Frenzel, H.1
Lajn, A.2
Brandt, M.3
Von Wenckstern, H.4
Biehne, G.5
Hochmuth, H.6
Lorenz, M.7
Grundmann, M.8
-
34
-
-
77957323243
-
-
Park, J.; Ozbek, A. M.; Ma, L.; Veety, M. T.; Morgensen, M. P.; Barlage, D. W.; Wheeler, V. D.; Johnson, M. A. L. Solid-State Electron. 2010, 54 (12) 1680-1685
-
(2010)
Solid-State Electron.
, vol.54
, Issue.12
, pp. 1680-1685
-
-
Park, J.1
Ozbek, A.M.2
Ma, L.3
Veety, M.T.4
Morgensen, M.P.5
Barlage, D.W.6
Wheeler, V.D.7
Johnson, M.A.L.8
-
37
-
-
71649100636
-
-
Frenzel, H.; Lajn, A.; von Wenckstern, H.; Biehne, G.; Hochmuth, H.; Grundmann, M. Thin Solid Films 2009, 518 (4) 1119-1123
-
(2009)
Thin Solid Films
, vol.518
, Issue.4
, pp. 1119-1123
-
-
Frenzel, H.1
Lajn, A.2
Von Wenckstern, H.3
Biehne, G.4
Hochmuth, H.5
Grundmann, M.6
-
38
-
-
77950595426
-
-
Lin, Y. J.; Jheng, M. J.; Zeng, J. J. Appl. Surf. Sci. 2010, 256 (14) 4493-4496
-
(2010)
Appl. Surf. Sci.
, vol.256
, Issue.14
, pp. 4493-4496
-
-
Lin, Y.J.1
Jheng, M.J.2
Zeng, J.J.3
-
39
-
-
0033593712
-
-
Wang, C.; Snyder, J. P.; Tucker, J. R. Appl. Phys. Lett. 1999, 74 (8) 1174-1176
-
(1999)
Appl. Phys. Lett.
, vol.74
, Issue.8
, pp. 1174-1176
-
-
Wang, C.1
Snyder, J.P.2
Tucker, J.R.3
|