Source-gated thin-film transistors

IEEE Electron Device Letters

Volumn 24, Issue 6, 2003, Pages 405-407

  Shannon, J M ^a,b   Gerstner, E G ^a  

^a UNIVERSITY OF SURREY   (United Kingdom)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

FETs; MIS devices; Schottky barriers; Semiconductor devices; Thin film transistors

Indexed keywords

CHARGE CARRIERS; ELECTRIC CONDUCTANCE; ENERGY DISSIPATION; FIELD EFFECT TRANSISTORS; GAIN MEASUREMENT; GATES (TRANSISTOR); SCHOTTKY BARRIER DIODES;

SOURCE GATED TRANSISTORS;

THIN FILM TRANSISTORS;

EID: 0042091980     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2003.813379     Document Type: Article

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