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Volumn 25, Issue 2-4, 2010, Pages 145-149

The annealing effect on properties of ZnO thin film transistors with Ti/Pt source-drain contact

Author keywords

Annealing; Thin film transistor; Ti contact; ZnO

Indexed keywords

ANNEALING; CRYSTALLINITY; DISPLAY DEVICES; II-VI SEMICONDUCTORS; PLATINUM COMPOUNDS; SILICA; THIN FILM CIRCUITS; THIN FILMS; THRESHOLD VOLTAGE; ZINC OXIDE;

EID: 78049329517     PISSN: 13853449     EISSN: 15738663     Source Type: Journal    
DOI: 10.1007/s10832-010-9605-8     Document Type: Article
Times cited : (14)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.