Influence of post-deposition annealing on the structural and optical properties of ZnO thin films prepared by sol-gel and spin-coating method

Superlattices and Microstructures

Volumn 43, Issue 2, 2008, Pages 112-119

  Srinivasan, G ^a,b   Gopalakrishnan, N ^c   Yu, Y S ^d   Kesavamoorthy, R ^e   Kumar, J ^a  

^a ANNA UNIVERSITY   (India)

^b R M D ENGINEERING COLLEGE   (India)

^c NATIONAL INSTITUTE OF TECHNOLOGY   (India)

^d Dong Eui University   (South Korea)

^e INDIRA GANDHI CENTRE FOR ATOMIC RESEARCH   (India)

Author keywords

Annealing; Semiconductor; Sol gel; Thin film

Indexed keywords

ANNEALING; PHOTOLUMINESCENCE; RAMAN SCATTERING; SAPPHIRE; SOL-GEL PROCESS; SPIN COATING; SURFACE MORPHOLOGY; ZINC OXIDE;

DEFECT-RELATED EMISSION; EMISSION INTENSITY; POST-DEPOSITION ANNEALING; TWO-LINE STRUCTURE;

THIN FILMS;

EID: 38649124037     PISSN: 07496036     EISSN: 10963677     Source Type: Journal    
DOI: 10.1016/j.spmi.2007.07.032     Document Type: Article

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