Soft error sensitivity evaluation of microprocessors by multilevel emulation-based fault injection

IEEE Transactions on Computers

Volumn 61, Issue 3, 2012, Pages 313-322

  Entrena, Luis ^a   García Valderas, Mario ^a   Fernández Cardenal, Raul ^a   Lindoso, Almudena ^a   Portela, Marta García ^a   López Ongil, Celia ^a  

^a UNIVERSIDAD CARLOS III DE MADRID   (Spain)

Author keywords

fault injection; FPGA emulation; single event transient; single event upset; Soft error

Indexed keywords

FAULT INJECTION; FPGA EMULATION; SINGLE EVENT TRANSIENTS; SINGLE EVENT UPSET; SOFT ERROR;

APPLICATION SPECIFIC INTEGRATED CIRCUITS; COMPUTER CONTROL SYSTEMS; DELAY CIRCUITS; MICROPROCESSOR CHIPS;

TRANSIENTS;

EID: 84856253098     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/TC.2010.262     Document Type: Article

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