Accurate Single-Event-Transient Analysis via Zero-Delay Logic Simulation

IEEE Transactions on Nuclear Science

Volumn 50, Issue 6 I, 2003, Pages 2113-2118

  Violante, Massimo ^a  

^a POLITECNICO DI TORINO   (Italy)

Author keywords

Fault injection; Single event effects

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; DELAY CIRCUITS; ELECTRIC NETWORK TOPOLOGY; FAULT TOLERANT COMPUTER SYSTEMS; FLIP FLOP CIRCUITS; MATHEMATICAL MODELS; SEQUENTIAL CIRCUITS; TRANSIENTS;

FAULT INJECTION; SINGLE-EVENT EFFECTS; SINGLE-EVENT TRANSIENTS (SET);

COMBINATORIAL CIRCUITS;

EID: 1242310273     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2003.820729     Document Type: Conference Paper

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