Simulating single event transients in VDSM ICs for ground level radiation

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 20, Issue 4, 2004, Pages 413-421

  Alexandrescu, Dan ^a   Anghel, Lorena ^b   Nicolaidis, Michael ^a  

^a iRoC Technologies   (France)

^b TIMA LABORATORY   (France)

Author keywords

Fault simulation; Single event upsets; Single fault propagation; Soft errors

Indexed keywords

FAULT SIMULATION; SINGLE EVENT UPSETS; SINGLE FAULT PROPAGATION; SOFT-ERRORS;

ALGORITHMS; BENCHMARKING; COMPUTER SIMULATION; ELECTRIC POTENTIAL; ERROR ANALYSIS; NETWORKS (CIRCUITS); SPURIOUS SIGNAL NOISE; STATISTICAL METHODS; TRANSISTORS;

INTEGRATED CIRCUIT TESTING;

EID: 4444251694     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1023/B:JETT.0000039608.48856.33     Document Type: Conference Paper

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