A new approach to estimate the effect of single event transients in complex circuits

IEEE Transactions on Nuclear Science

Volumn 54, Issue 4, 2007, Pages 1018-1024

  Aguirre, M A ^a   Baena, V ^a   Tombs, J ^a   Violante, M ^b  

^a UNIVERSIDAD DE SEVILLA   (Spain)

^b POLITECNICO DI TORINO   (Italy)

Author keywords

Fault injection; FPGA based fault emulation; Single event transients; Soft errors

Indexed keywords

COMPUTER HARDWARE; COMPUTER SIMULATION; FIELD PROGRAMMABLE GATE ARRAYS (FPGA); FLIP FLOP CIRCUITS; MICROPROCESSOR CHIPS; TRANSIENTS;

EMULATION; FAULT INJECTION; SINGLE EVENT TRANSIENTS (SET); SOFT ERRORS;

DIGITAL CIRCUITS;

EID: 34548090425     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2007.895549     Document Type: Conference Paper

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