Total reflection X-ray fluorescence analysis: Physical foundations and analytical application (A review)

Inorganic Materials

Volumn 47, Issue 14, 2011, Pages 1487-1499

  Alov, N V ^a  

^a MOSCOW STATE UNIVERSITY   (Russian Federation)

Author keywords

chemical analysis; surface; total external reflection of X rays; X ray fluorescence analysis

Indexed keywords

EID: 83455205967     PISSN: 00201685     EISSN: 16083172     Source Type: Journal    
DOI: 10.1134/S0020168511140020     Document Type: Article

References (79)

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