Nanophotonics and nanometrology with planar X-ray waveguide-resonator

Applied Surface Science

Volumn 253, Issue 1 SPEC. ISS., 2006, Pages 138-144

  Egorov, V K ^a   Egorov, E V ^a  

^a INSTITUTE OF MICROELECTRONICS TECHNOLOGY AND HIGH PURITY MATERIALS   (Russian Federation)

Author keywords

Interference field of X ray standing wave; Planar X ray waveguide resonator (PXWR); Total reflection X ray fluorescence (TXRF)

Indexed keywords

FLUORESCENCE; LIGHT INTERFERENCE; REFLECTION; RESONANCE; WAVE PROPAGATION; WAVEGUIDES; X RAY ANALYSIS;

INTERFERENCE FIELD OF X-RAY STANDING WAVES; PLANAR X-RAY WAVEGUIDE-RESONATOR (PXWR); TOTAL REFLECTION X-RAY FLUORESCENCE (TXRF);

RESONATORS;

EID: 33750597769     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.05.109     Document Type: Article

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