Recent and future developments in low power total reflection X-ray fluorescence spectroscopy

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 61, Issue 10-11 SPEC. ISS., 2006, Pages 1115-1118

  Waldschlaeger, U ^a  

^a Roentec GmbH   (Germany)

Author keywords

Instrument development; Low power; TXRF

Indexed keywords

FLUORESCENCE; QUANTUM EFFICIENCY; SENSITIVITY ANALYSIS; SPECTROMETERS; THERMOELECTRICITY; X RAY SPECTROSCOPY;

INSTRUMENT DEVELOPMENT; LOW POWER; TXRF;

X RAY TUBES;

EID: 34948877820     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2006.10.005     Document Type: Article

References (4)

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2. Stosnach H. Environmental trace element analysis using a benchtop total reflection X-ray fluorescence (TXRF) spectrometer. Anal. Sci. 21 (2005) 873-876
3. Stosnach H. Trace element analysis using a benchtop total reflection X-ray fluorescence spectrometer. Powder Diffr. 20 2 (2005) 141-145
4. Mages M., Woelfl S., Óvári M., and Tümpling jun W.v. The use of a portable total reflection X-ray fluorescence spectrometer for field investigation. Spectrochim. Acta Part B 58 (2003) 2129-2138