Total reflection X-ray fluorescence—an efficient method for micro-, trace and surface layer analysis*: Invited lecture

Journal of Analytical Atomic Spectrometry

Volumn 7, Issue 2, 1992, Pages 273-279

  Klockenkämper, Reinhold ^a   Von Bohlen, Alex ^a  

^a LEIBNIZ INSTITUT FÜR ANALYTISCHE WISSENSCHAFTEN ISAS E V   (Germany)

Author keywords

Energy dispersive analysis; Microanalysis; Surface layer analysis; Total reflection X ray fluorescence; Trace analysis

Indexed keywords

EID: 0039476471     PISSN: 02679477     EISSN: 13645544     Source Type: Journal    
DOI: 10.1039/JA9920700273     Document Type: Article

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