Application of total-reflection X-ray fluorescence spectrometry to the analysis of airborne particulate matter

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 52, Issue 7, 1997, Pages 985-994

  Schmeling, M ^a   Klockenkamper R ^a   Klockow, D ^a  

^a LEIBNIZ INSTITUT FÜR ANALYTISCHE WISSENSCHAFTEN ISAS E V   (Germany)

Author keywords

Airborne particulate matter; Blank values; Impaction; Memory effects; TXRF

Indexed keywords

AIR FILTERS; CHROMIUM; FILTRATION; FLUORESCENCE; IRON; MANGANESE; NICKEL; NITRIC ACID; STAINLESS STEEL; TRACE ANALYSIS; TRACE ELEMENTS; X RAY SPECTROSCOPY;

BLANK VALUES; DETECTION LIMIT; TOTAL REFLECTION X RAY FLUORESCENCE (TXRF) SPECTROMETRY;

PARTICLES (PARTICULATE MATTER);

EID: 0031169822     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0584-8547(96)01673-4     Document Type: Article

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