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Volumn 63, Issue 12, 1997, Pages 729-731
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X-ray fluorescence and total external reflection X-ray fluorescence analysis of films of ferroelectric complex oxides
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 33748896689
PISSN: 00198447
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (1)
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References (9)
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