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Volumn 63, Issue 12, 1997, Pages 729-731

X-ray fluorescence and total external reflection X-ray fluorescence analysis of films of ferroelectric complex oxides

Author keywords

[No Author keywords available]

Indexed keywords


EID: 33748896689     PISSN: 00198447     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (1)

References (9)
  • 2
    • 33748910832 scopus 로고
    • Deposition of thin films by cathode sputtering
    • Mir, Moscow
    • L. I. Meissel, "Deposition of thin films by cathode sputtering," in: Physics of Thin Films [Russian translation], Vol. III, Mir, Moscow (1968), p. 58.
    • (1968) Physics of Thin Films [Russian Translation] , vol.3 , pp. 58
    • Meissel, L.I.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.