Arrangement of trace metal contaminations in thin films of liquid crystals studied by X-ray standing wave technique

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 61, Issue 10-11 SPEC. ISS., 2006, Pages 1229-1235

  Novikova, N N ^a   Zheludeva, S I ^a   Stepina, N D ^a   Tolstikhina, A L ^a   Gaynutdinov, R V ^a   Haase, W ^b   Erko, A I ^c   Knyazev, A A ^d   Galyametdinov, Yu G ^d  

^a SHUBNIKOV INSTITUTE OF CRYSTALLOGRAPHY   (Russian Federation)

^b DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^c HAHN MEITNER INSTITUT   (Germany)

^d ZAVOISKY PHYSICAL TECHNICAL INSTITUTE   (Russian Federation)

Author keywords

Langmuir Blodgett films; Metal ions; Metallomesogen; Total external reflection; X ray fluorescence

Indexed keywords

CONTAMINATION; FLUORESCENCE; LANGMUIR BLODGETT FILMS; THIN FILMS; TRACE ELEMENTS;

METAL IONS; METALLOMESOGEN; TOTAL EXTERNAL REFLECTION; X-RAY FLUORESCENCE;

LIQUID CRYSTALS;

EID: 34948864661     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2006.07.006     Document Type: Article

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