SEM, EPMA and TXRF characterization of electrochemically modified electrode surfaces

Microscopy and Microanalysis

Volumn 9, Issue SUPPL. 3, 2003, Pages 138-139

  Alov, Nikolai ^a   Ceglarek, Doris ^b   Wittershagen, Axel ^c   Kolbesen, Bernd O ^b  

^a MOSCOW STATE UNIVERSITY   (Russian Federation)

^b GOETHE UNIVERSITY   (Germany)

^c SEZ AG   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0142092199     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927603016003     Document Type: Conference Paper

References (3)

1. N.V. Alov, K.V. Oskolok, A. Wittershagen, M. Mertens, C. Rittmeyer, P. Rostam-Khani, B.O. Kolbesen, Spectrochimica Acta Part B 56 (2001) 2117.
2. N.V. Alov, K.V. Oskolok, X-Ray Spectrometry 31 (2002) 235.
3. N.V. Alov, K.V. Oskolok, Microscopy and Analysis 81 (2003) 5.