Comparison of total-reflection X-ray fluorescence, static and portable energy dispersive X-ray fluorescence spectrometers for art and archeometry studies

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 59, Issue 10-11, 2004, Pages 1581-1586

  Ardid, M ^a,b   Ferrero, J L ^a   Juanes, D ^a   Lluch, J L ^a   Roldan C ^a  

^a UNIVERSITY OF VALENCIA   (Spain)

^b UNIVERSITAT POLITÈCNICA DE VALÈNCIA   (Spain)

Author keywords

Applications in art and archeometry; EDXRF: energy dispersive X ray fluorescence spectrometry; Scientific techniques in conservation and restoration; TXRF: total reflection X ray analysis

Indexed keywords

CONTAMINATION; FLUORESCENCE; MATERIALS SCIENCE; SENSITIVITY ANALYSIS; TRACE ELEMENTS; X RAY SPECTROMETERS;

APPLICATIONS IN ART AND ARCHEOMETRY; ENERGY DISPERSIVE X-RAY FLUORESCENCE SPECTROMETRY (EDXRF); SCIENTIFIC TECHNIQUES IN CONSERVATION AND RESTORATION; TOTAL-REFLECTION X-RAY FLUORESCENCE (TXRF);

ENERGY DISPERSIVE SPECTROSCOPY;

EID: 5444241003     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2004.03.013     Document Type: Conference Paper

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