Assessment of lattice strain, rotation and dislocation content using electron back-scatter diffraction

Journal of Physics: Conference Series

Volumn 326, Issue 1, 2011, Pages

  Wilkinson, Angus J ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; DIFFRACTION; GALLIUM NITRIDE; SAPPHIRE; TENSORS;

ANGULAR SENSITIVITY; BASAL PLANE SAPPHIRE; CROSS CORRELATIONS; ELASTIC STRAIN FIELDS; ELECTRON BACK SCATTER DIFFRACTION; INTERFACIAL DISLOCATIONS; SEMICONDUCTING MATERIALS; THREADING DISLOCATION DENSITIES;

WIDE BAND GAP SEMICONDUCTORS;

EID: 82955219776     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/326/1/012004     Document Type: Conference Paper

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