Lattice distortions in GaN thin films on (0001) sapphire

Journal of Physics: Conference Series

Volumn 209, Issue , 2010, Pages

  Sridhara Rao, D V ^a   Beanland, R ^a,b   Kappers, M J ^a   Zhu, D ^a   Humphreys, J ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b UNIVERSITY OF WARWICK   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

GALLIUM NITRIDE; LANTHANUM COMPOUNDS; SAPPHIRE; STRAIN;

CONTINUOUS FILMS; CONVERGENT BEAM ELECTRON DIFFRACTION (CBED); ELECTRON BACK SCATTER DIFFRACTION; GAN THIN FILMS; GAN/SAPPHIRE; LATTICE DISTORTIONS; MICROSCOPE SPECIMENS; MOSAIC STRUCTURE;

ELECTRON DIFFRACTION;

EID: 77950470676     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/209/1/012022     Document Type: Conference Paper

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