Electron backscatter diffraction and electron channeling contrast imaging of tilt and dislocations in nitride thin films

Physical Review B - Condensed Matter and Materials Physics

Volumn 75, Issue 8, 2007, Pages

  Trager Cowan, C ^a   Sweeney, F ^a   Trimby, P W ^b   Day, A P ^b   Gholinia, A ^b   Schmidt, N H ^b   Parbrook, P J ^c   Wilkinson, A J ^d   Watson, I M ^a  

^a UNIVERSITY OF STRATHCLYDE   (United Kingdom)

^b HKL Technology ApS   (Denmark)

^c UNIVERSITY OF SHEFFIELD   (United Kingdom)

^d UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33846692786     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.75.085301     Document Type: Article

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