Distinguishing crystallographic misorientations of lanthanum zirconate epilayers on nickel substrates by electron backscatter diffraction

Ultramicroscopy

Volumn 111, Issue 5, 2011, Pages 314-319

  Ji, Yuan ^a   Wang, Li ^a   Zhang, Yinqi ^a   Wei, Bin ^a   Wang, Jianhong ^a   Cheng, Yanling ^a   Suo, Hongli ^a  

^a BEIJING UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

Crystallographic misorientation; Electron backscatter diffraction (EBSD); Epilayer; La2Zr2O7 buffer

Indexed keywords

CRYSTALLOGRAPHIC AXES; CRYSTALLOGRAPHIC ORIENTATIONS; CUBE TEXTURE; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION (EBSD); EPITAXIALLY GROWN; IN-PLANE; LA2ZR2O7 BUFFER; LANTHANUM ZIRCONATE; LOCAL LATTICE; LOW ENERGIES; MIS-ORIENTATION; MISFIT STRAINS; MISORIENTATIONS; NICKEL SUBSTRATES; ORIENTATION DATA; OUT-OF-PLANE ORIENTATION; PRIMARY ELECTRONS; YBCO SUPERCONDUCTOR;

BACKSCATTERING; ELECTRON DIFFRACTION; ELECTRONS; EPILAYERS; GEOMETRY; LANTHANUM; YTTRIUM BARIUM COPPER OXIDES; ZIRCONIUM;

SUBSTRATES;

LANTHANUM; LANTHANUM ZIRCONATE; NICKEL; UNCLASSIFIED DRUG;

ANALYTIC METHOD; ARTICLE; CHEMICAL ANALYSIS; CONTROLLED STUDY; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; ELECTRON BACKSCATTER DIFFRACTION; ELECTRON DIFFRACTION; IMAGE ANALYSIS; IMAGE QUALITY; MOLECULAR STABILITY; STRUCTURE ANALYSIS; SURFACE PROPERTY;

EID: 79551609100     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.01.006     Document Type: Article

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