AFM Nanoindentation of viscoelastic materials with large end-Radius probes

Journal of Polymer Science, Part B: Polymer Physics

Volumn 47, Issue 16, 2009, Pages 1573-1587

  Moeller, Gunter ^a  

^a ARKEMA INC   (United States)

Author keywords

Atomic force microscopy (AFM); Creep; Indentation; Plastics; Viscoelastic properties

Indexed keywords

ACCURACY IMPROVEMENT; AFM; AFM NANOINDENTATION; AFM TIP; ANALYSIS METHOD; ATOMIC FORCE MICROSCOPY (AFM); CANTILEVER STIFFNESS; CREEP TESTS; DATA ANALYSIS; HETEROGENEOUS MATERIALS; HIGH STIFFNESS; HIGH-RESOLUTION IMAGING; INDENTERS; MECHANICAL PROPERTIES OF POLYMERS; MODULUS MEASUREMENTS; PROJECTED AREA; SMALL LOAD; SPHERICAL INDENTERS; VISCO-ELASTIC MATERIAL; VISCOELASTIC PROPERTIES;

ATOMS; CREEP; DYNAMIC ANALYSIS; DYNAMIC MECHANICAL ANALYSIS; ELASTIC MODULI; ELASTOMERS; MECHANICAL PROPERTIES; NANOINDENTATION; PHOTORESISTS; PLASTICITY; PLASTICS; POLYMERS; PROBES; STIFFNESS; VICKERS HARDNESS TESTING; VISCOELASTICITY;

ATOMIC FORCE MICROSCOPY;

EID: 68249138501     PISSN: 08876266     EISSN: None     Source Type: Journal    
DOI: 10.1002/polb.21758     Document Type: Article

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