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Volumn 108, Issue 9, 2008, Pages 821-825
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An improved in situ measurement of offset phase shift towards quantitative damping-measurement with AFM
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Author keywords
AFM; Dynamic nanoindentation; Mechanical damping
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CARBON NANOTUBES;
DAMPING;
DYNAMIC ANALYSIS;
DYNAMIC MECHANICAL ANALYSIS;
EXTREME ULTRAVIOLET LITHOGRAPHY;
MEASUREMENTS;
NANOTECHNOLOGY;
PHASE SHIFT;
ATOMIC FORCE MICROSCOPE (AFM);
CONTACT FORCES;
DAMPING MEASUREMENTS;
DEFLECTION (OVALIZATION);
DYNAMIC MECHANICAL;
ELSEVIER (CO);
IN-SITU MEASUREMENTS;
INDIVIDUAL (PSS 544-7);
MECHANICAL DAMPING;
MULTIWALLED CARBON NANOTUBES (MW-CNT);
NANO SCALE MATERIALS;
ONE-DIMENSIONAL (1D) NANOSTRUCTURES;
SOFT MATERIALS;
MULTIWALLED CARBON NANOTUBES (MWCN);
CARBON NANOTUBE;
NANOMATERIAL;
POLYMER;
AMPLITUDE MODULATION;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
DYNAMICS;
OSCILLATION;
QUANTITATIVE STUDY;
STOCHASTIC MODEL;
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EID: 48149084323
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/j.ultramic.2008.01.005 Document Type: Article |
Times cited : (6)
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References (21)
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