An improved in situ measurement of offset phase shift towards quantitative damping-measurement with AFM

Ultramicroscopy

Volumn 108, Issue 9, 2008, Pages 821-825

  Minary Jolandan, Majid ^a   Yu, Min Feng ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

AFM; Dynamic nanoindentation; Mechanical damping

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; DAMPING; DYNAMIC ANALYSIS; DYNAMIC MECHANICAL ANALYSIS; EXTREME ULTRAVIOLET LITHOGRAPHY; MEASUREMENTS; NANOTECHNOLOGY; PHASE SHIFT;

ATOMIC FORCE MICROSCOPE (AFM); CONTACT FORCES; DAMPING MEASUREMENTS; DEFLECTION (OVALIZATION); DYNAMIC MECHANICAL; ELSEVIER (CO); IN-SITU MEASUREMENTS; INDIVIDUAL (PSS 544-7); MECHANICAL DAMPING; MULTIWALLED CARBON NANOTUBES (MW-CNT); NANO SCALE MATERIALS; ONE-DIMENSIONAL (1D) NANOSTRUCTURES; SOFT MATERIALS;

MULTIWALLED CARBON NANOTUBES (MWCN);

CARBON NANOTUBE; NANOMATERIAL; POLYMER;

AMPLITUDE MODULATION; ARTICLE; ATOMIC FORCE MICROSCOPY; DYNAMICS; OSCILLATION; QUANTITATIVE STUDY; STOCHASTIC MODEL;

EID: 48149084323     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2008.01.005     Document Type: Article

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