Measuring local viscoelastic properties of complex materials with tapping mode atomic force microscopy

Polymer

Volumn 47, Issue 13, 2006, Pages 4798-4810

  Xu, Wensheng ^a   Wood Adams, Paula M ^a   Robertson, Christopher G ^b  

^a Gina Cody School of Engineering and Computer Science   (Canada)

^b Bridgestone Americas Center for Research and Technology   (United States)

Author keywords

Atomic force microscopy; Thin films; Viscoelasticity

Indexed keywords

ATOMIC FORCE MICROSCOPY; OSCILLATIONS; POLYMERS; SILICON; THIN FILMS; VISCOELASTICITY;

EXCITATION SIGNALS; MICRO-CANTILEVER; NANOMETERS; POLYMER SURFACES;

MATERIALS SCIENCE;

MATHEMATICAL MODEL; MECHANICAL PROPERTY; MICROSCOPY; POLYMER PROPERTY; SILICON; SURFACE PROPERTY; VISCOELASTICITY;

EID: 33746921228     PISSN: 00323861     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.polymer.2006.04.032     Document Type: Article

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