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Volumn 19, Issue 47, 2007, Pages

Measurement and interpretation of elastic and viscoelastic properties with the atomic force microscope

Author keywords

[No Author keywords available]

Indexed keywords

ADHESIVES; ATOMIC FORCE MICROSCOPY; BUBBLE FORMATION; VAN DER WAALS FORCES; VISCOELASTICITY;

EID: 36048979017     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/19/47/473201     Document Type: Review
Times cited : (60)

References (135)
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    • Attard P 2001 Phys. Rev. E 63 061604
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    • Attard, P.1
  • 79
    • 0035838797 scopus 로고    scopus 로고
    • Attard P 2001 Langmuir 17 4322
    • (2001) Langmuir , vol.17 , Issue.14 , pp. 4322
    • Attard, P.1
  • 107
  • 129
    • 4243479566 scopus 로고    scopus 로고
    • Attard P 2001 Phys. Rev. E 63 011601
    • (2001) Phys. Rev. , vol.63 , Issue.1 , pp. 011601
    • Attard, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.