Imaging surfaces of nano-scale roughness by atomic force microscopy with carbon nanotubes as tips: A comparative study

Surface and Interface Analysis

Volumn 43, Issue 11, 2011, Pages 1382-1391

  Munz, Martin ^a   Kim, Jae Ho ^b   Krause, Oliver ^c   Roy, Debdulal ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^b Ajou University   (South Korea)

^c NANOWORLD SERVICES GMBH   (Germany)

Author keywords

atomic force microscopy scanning probe microscopy; buckling; carbon nanotube; CNT AFM tip probe; elastic deformation; intermittent contact mode tapping mode; niobium film; polycrystalline surface; power spectral density; root mean square roughness

Indexed keywords

AFM TIP; INTERMITTENT CONTACT MODES; NIOBIUM FILM; POLYCRYSTALLINE SURFACE; POWER SPECTRAL; PROBE MICROSCOPY; ROOT MEAN SQUARE ROUGHNESS;

ALGEBRA; CARBON NANOTUBES; CHEMICAL VAPOR DEPOSITION; FILM PREPARATION; NANOPROBES; NIOBIUM; POWER SPECTRAL DENSITY; SILICON NITRIDE; SPECTRAL DENSITY; SURFACE ROUGHNESS;

ATOMIC FORCE MICROSCOPY;

EID: 80053957181     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3727     Document Type: Article

References (29)

1. O. Marti, in Handbook of Micro/Nano Tribology (Ed:, B. Bhushan,), 2nd edition, CRC Press: Boca Raton, 1999, pp. 81.
2. C. A. Clifford, M. P. Seah, Meas. Sci. Technol. 2009, 20, 095103 (p 8).
3. E. Meyer, H.-J. Hug, R. Bennewitz, Scanning Probe Microscopy-The lab on a tip. Advanced Texts in Physics series. Springer-Verlag: Berlin Heidelberg, 2004, Chap. 6.
4. J.-P. Salvetat, G. A. D. Briggs, J.-M. Bonard, R. R. Bacsa, A. J. Kulik, T. Stöckli, N. A. Burnham, L. Forró, Phys. Rev. Lett. 1999, 82, 944.
5. D. Dietzel, S. Marsaudon, J. P. Aimé, C. V. Nguyen, G. Couturier, Phys. Rev. B 2005, 72, 035445.
6. M. R. Falvo, G. J. Clary, R. M. Taylor, V. Chi, F. P. Brooks, S. Washburn, R. Superfine, Nature 1997, 389, 582.
7. A. Kutana, K. P. Giapis, J. Y. Chen, C. P. Collier, Nano Letters 2006, 6, 1669.
8. C. V. Nguyen, Q. Ye, M. Meyyappan, Meas. Sci. Technol. 2005, 16, 2138.
9. Y. Ando, N. Shiraishi, Rev. Sci. Instrum. 2007, 78, 033701.
10. S.-K. Kim, M.-H. Jung, H.-W. Kim, S.-G. Woo, H. Lee, Nanotechnology 2005, 16, 2227.
11. M. C. Strus, A. Raman, C.-S. Han, C. V. Nguyen, Nanotechnology 2005, 16, 2482.
12. F. Z. Fang, Z. W. Xu, S. Dong, Meas. Sci. Technol. 2008, 19, 055501.
13. O. Krause, V. Bouchiat, A. M. Bonnot, J. Phys.: Conf. Series 2007, 61, 628.
14. C. V. Nguyen, K.-J. Chao, R. M. D. Stevens, L. Delzeit, A. Cassell, J. Han, M. Meyyappan, Nanotechnology 2001, 12, 363.
15. S. Gawad, M. Giugliano, M. Heuschkel, B. Wessling, H. Markram, U. Schnakenberg, P. Renaud, H. Morgan, Frontiers Neuroeng. 2009, 2, 1.
16. J. T. W. Yeow, J. P. M. She, Nanotechnology 2006, 17, 5441.
17. B. Bhushan, J. Vac. Sci. Technol. B 2003, 21, 2262.
18. F. Walther, W. M. Heckl, R. W. Stark, Appl. Surf. Sci. 2008, 254, 7290.
19. J.-H. Lee, W.-S. Kang, B.-S. Choi, S.-W. Choi, J.-H. Kim, Ultramicroscopy 2008, 108, 1163.
20. I. Horcas, R. Fernandez, J. M. Gomez-Rodriguez, J. Colchero, J. Gomez-Herrero, A. M. Baro, Rev. Sci. Instrum. 2007, 78, 013705.
21. D. C. Champeney, Fourier transforms and their physical applications. Techniques of Physics series. Academic Press: London and New York, 1973, 66.
22. A. Majumdar, B. Bhushan, in Handbook of Micro/Nano Tribology (Ed:, B. Bhushan,), 2nd edition, CRC Press: Boca Raton, 1999, pp. 187.
23. S. J. Fang, S. Haplepete, W. Chen, C. R. Helms, H. Edwards, J. Appl. Phys. 1997, 82, 5891.
24. E. S. Snow, P. M. Campbell, J. P. Novak, Appl. Phys. Lett. 2002, 80, 2002.
25. S. D. Solares, Y. Matsuda, W. A. Goddard, J. Phys. Chem. B 2005, 109, 16658.
26. V. Cimalla, T. Machleidt, L. Spieß, M. Gubisch, I. Hotovy, H. Romanus, O. Ambacher, Ultramicroscopy 2007, 107, 989.
27. G. Palasantzas, Phys. Rev. B 1993, 48, 14472.
28. D. Ronnow, J. Isidorsson, G. A. Niklasson, Phys. Rev. E 1996, 54, 4021.
29. M. Senthilkumar, N. K. Sahoo, S. Thakur, R. B. Tokas, Appl. Surf. Sci. 2005, 252, 1608.