Mechanical properties of a carbon nanotube fixed at a tip apex: A frequency-modulated atomic force microscopy study

Physical Review B - Condensed Matter and Materials Physics

Volumn 72, Issue 3, 2005, Pages

  Dietzel, D ^a   Marsaudon, S ^a   Aime J P ^a   Nguyen, C V ^b   Couturier, G ^a  

^a UNIVERSITÉ DE BORDEAUX   (France)

^b NASA AMES RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33749159010     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.72.035445     Document Type: Article

References (29)

1. S. Iijima, Nature (London) NATUAS 0028-0836 10.1038/354056a0, 354, 56 (1991).
2. H. W. Zhu, C. L. Xu, D. H. Wu, B. Q. Wei, R. Vatjai, and P. M. Ajayan, Science SCIEAS 0036-8075 10.1126/science.1066996 296, 884 (2002).
3. C. H. Kiang, M. Endo, P. M. Ajayan, G. Dresselhaus, and M. S. Dresselhaus, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.81.1869 81, 1869 (1998).
4. A. Thess, Science SCIEAS 0036-8075 273, 483 (1996).
5. C. V. Nguyen, K. J. Chao, R. M. D. Stevens, L. Delzeit, A. Cassel, J. Hans, and M. Meyyappan, Nanotechnology NNOTER 0957-4484 10.1088/0957-4484/12/3/ 326 12, 363 (2001).
6. W. Z. Li, S. S. Xie, L. X. Qian, B. H. Chang, B. S. Zou, R. A. Zhao, and G. Wang, Science SCIEAS 0036-8075 10.1126/science.283.5401.512 283, 512 (1999).
7. L. Marty, V. Bouchiat, A. M. Bonnot, M. Chaumont, T. Fournier, S. Decossas, and S. Roche, Microelectron. Eng. MIENEF 0167-9317 61-62, 485 (2002).
8. T. R. Albrecht, P. Grütter, D. Horne, and D. Rugar, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.347347 69, 668 (1991).
9. NanoSurf A.G. Easy PLL FM-detector and sensor controller, www.nanosurf.com
10. J. P. Cleveland, B. Anczykowski, A. E. Schmid, and V. B. Elings, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.121434 72, 2613 (1998).
11. U. Dürig, New J. Phys. NJOPFM 1367-2630 2, 5.1 (2000).
12. R. Boisgard, J. P. Aimé, and G. Couturier, Surf. Sci. SUSCAS 0039-6028 10.1016/S0039-6028(02)01436-X 511, 171 (2002);
13. F. Dubourg, J. P. Aimé, S. Marsaudon, R. Boisgard, and P. Leclère, Eur. Phys. J. E EPJSFH 1292-8941, 6, 49-55, (2001).
14. J.-P. Salvetat, A. J. Kulik, J.-M. Bonard, G. Andrew D. Briggs, T. Stöckli, K. Méténier, Sylvie Bonnamy, F. Béguin, N. A. Burnham, and L. Forró, Adv. Mater. (Weinheim, Ger.) ADVMEW 0935-9648 10.1002/(SICI)1521-4095(199902)11:2<161::AID-ADMA161>3.0.CO;2-J 11, 161 (1999).
15. S. Cuenot, C. Frétigny, S. Demoustier-Champagne, and B. Nysten, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1565675 93, 5650 (2003);
16. S. Cuenot, S. Demoustier-Champagne, and B. Nysten, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.85.1690 85, 1690 (2000).
17. A. Kis, S. Kasas, B. Babić, A. J. Kulik, W. Benoît, G. A. D. Briggs, C. Schönenberger, S. Catsicas, and L. Forró, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.89.248101 89, 248101 (2002).
18. J. P. Aimé, R. Boisgard, L. Nony, and G. Couturier, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.82.3388 82, 3388 (1999).
19. U. Dürig, Surf. Interface Anal. SIANDQ 0142-2421 10.1002/(SICI)1096-9918(199905/06)27:5/6<467::AID-SIA519>3.0.CO;2-7 27, 467 (1999).
20. L. Nony, R. Boisgard, and J. P. Aimé, J. Chem. Phys. JCPSA6 0021-9606 10.1063/1.479422, 111, 1615 (1999).
21. L. D. Landau and E. M. Lifshitz, Theory of Elasticity (Pergamon, London, 1959).
22. P. Bugl and S. Fujita, J. Chem. Phys. JCPSA6 0021-9606 10.1063/1.1671534 50, 3137 (1969).
23. G. Couturier, R. Boisgard, L. Nony, and J. P. Aimé, Rev. Sci. Instrum. RSINAK 0034-6748 10.1063/1.1564274 74, 2726 (2003).
24. D. Maugis, Mater. Sci. MSCJDS 0137-1339 20, 3041 (1985).
25. F. J. Giessibl, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.56.16010, 56, 16010 (1997).
26. H. Hölscher, B. Gotsmann, W. Allers, U. D. Schwarz, H. Fuchs, and R. Weisendanger, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.64.075402 64, 075402 (2001).
27. J. D. Ferry, Viscoelastic Properties of Polymers (Wiley, New York, 1970).
28. E. O. Tuck, J. Eng. Math. JLEMAU 0022-0833 10.1023/A:1004230831667, 3, 29 (1969);
29. J. E. Sader, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.368002, 84, 64 (1998).