Simplified drift characterization in scanning probe microscopes using a simple two-point method

Measurement Science and Technology

Volumn 20, Issue 9, 2009, Pages

  Clifford, Charles A ^a   Seah, Martin P ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

Calculable resistor; Coaxial resistor; Impedance measurements; Quantum Hall effect

Indexed keywords

ATOMIC FORCE MICROSCOPY; PIXELS; RESISTORS;

CLOSED LOOPS; DRIFT CHARACTERIZATION; FIELD OF VIEWS; IMAGE DISTORTIONS; IMPEDANCE MEASUREMENT; SCANNING PROBES; SOFTWARE PROGRAMMING; TWO-POINT METHOD;

QUANTUM HALL EFFECT;

EID: 70350689779     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/20/9/095103     Document Type: Article

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