Fabrication of carbon nanotube AFM probes using the Langmuir-Blodgett technique

Ultramicroscopy

Volumn 108, Issue 10, 2008, Pages 1163-1167

  Lee, Jae Hyeok ^a   Kang, Won Seok ^a   Choi, Bung Sam ^a   Choi, Sung Wook ^a   Kim, Jae Ho ^a  

^a Ajou University   (South Korea)

Author keywords

Atomic force microscopy; Carbon nanotube; Langmuir Blodgett technique

Indexed keywords

ATOMIC FORCE MICROSCOPY; BIOLOGICAL MATERIALS; CARBON; CARBON NANOTUBES; ELECTRON ENERGY LEVELS; FABRICATION; MICROSCOPIC EXAMINATION; NANOCOMPOSITES; NANOPORES; NANOPROBES; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOTECHNOLOGY; NANOTUBES; OFFSHORE OIL WELL PRODUCTION; OPTICAL DESIGN; ORGANIC ACIDS; SCANNING PROBE MICROSCOPY; SINGLE-WALLED CARBON NANOTUBES (SWCN); SULFUR COMPOUNDS;

A-STABLE; AFM MEASUREMENTS; AMIDATION; CARBON NANOTUBE; DEOXYRIBONUCLEIC ACID; FINE RESOLUTION; HIGH-RESOLUTION IMAGING; LANGMUIR MONOLAYERS; LANGMUIR-BLODGETT TECHNIQUE; LANGMUIR-BLODGETT TECHNIQUES; LB METHODS; NANO STRUCTURING; NANO-POROUS; SCALABLE PROCESS; SIMPLE METHODS; SINGLE-WALLED CARBON NANOTUBE; THIOPHENYL; TWO-STEP TRANSFER; WATER SURFACES; WATER/AIR INTERFACE;

IMAGING TECHNIQUES;

ALUMINUM OXIDE; DNA; SINGLE WALLED NANOTUBE;

ARTICLE; ATOMIC FORCE MICROSCOPY; ELECTRIC FIELD; IMAGING; ISOTHERM; LANGMUIR BLODGETT FILM; NANOPROBE; SCANNING ELECTRON MICROSCOPY;

EID: 49949098497     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2008.04.073     Document Type: Article

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